VNA microwave/RF test assemblies perform up to 70GHz

Posted By : Mick Elliott
VNA microwave/RF test assemblies perform up to 70GHz

The functional frequency range of Gore’s “FF series” GORE VNA Microwave/RF Test Assemblies, has been expanded to offer stable, reliable performance up to 70GHz. This upgrade addresses industry requirements for enhanced performance in the 60-70GHz range where there is increased need to maintain measurement accuracy, especially in Vector Network Analysers (VNAs), Communication Testing, and mm-Wave.

Instant and/or highly repetitive movement of cables can compromise the measurement precision of high-performance VNAs.

Leading manufacturers such as Keysight and Rohde & Schwarz choose GORE VNA Microwave/RF Test Assemblies because of the improved performance and reliability they see with their equipment.

“GORE VNA Microwave/RF Test Assemblies are engineered to provide the most precise VNA measurements under laboratory conditions, delivering the highest accuracy and the greatest time interval between recalibrations,” said Chris Cox, Gore Product Specialist, Electrical Cable & Components. “These assemblies have a rugged, lightweight construction that enables longer service life, reduced downtime, and lower operating costs over the life of the equipment.”

The test assemblies maintain excellent insertion loss and VSWR. Unlike conventionally designed RF test assemblies, Gore’s assemblies ensure accurate and repeatable measurements because of their excellent phase and amplitude stability with flexure.

And prior to shipment, all the assemblies are tested for return loss, insertion loss, phase stability, and loss stability up to their maximum operating frequency.

The assemblies are constructed with an abrasion-resistant polymer braid around a flexible armour casing. They withstand crush forces of more than 800 pounds force/inch and have an auto-limiting bend radius of 2.25 in (57.2 mm).

Even with this armoured and rugged construction, the VNA Microwave/RF Test Assemblies maintain excellent flexibility, which increases the cable’s life.

The assemblies include NMD-style ruggedised connectors for direct attachment to VNA test ports and allow the use of test port-compatible adapters for best durability and stability.

The combination of the assembly’s ruggedised construction and NMD-style connector ensures longer flex life with consistent performance and reduced frequency of recalibration.

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