Test & Measurement

TS-900 PXI Semiconductor Test System Expanded by Geotest

11th July 2012
ES Admin
0
Geotest has announced the expansion of the TS-900 platform's capabilities with the addition of a new manipulator option and automated handler compatible receiver. Designed specifically for the TS-900, The Reid-Ashman OM1069 manipulator allows precise positioning and flexibility for interfacing to device handlers and automated probers used for production testing of semiconductor devices.
The manipulator's spring loaded design allows for easy alignment and docking to handlers – eliminating the need for a complex receiver interface.

“By adding this configuration option to the TS-900, we are able to address a wider range of applications and production test requirements for our customers. Since the introduction of the TS-900 a year ago, we have been presented with a wide range of opportunities and with the addition of this option, our customers now have the option to leverage the TS-900 not only for bench top applications but also for automated handler applications.” commented Loofie Gutterman, president of Geotest.

The TS-900 also features a new handler compatible receiver, which offers the flexibility to interface to virtually any device handler. In addition, fixture compatibility is maintained with the TS-900's current receiver, allowing users to interchange load boards between the screw down and slide receiver configurations.

The TS-900 with the OM1069 manipulator is available now.

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier