The error detector for signal quality analyser at ECOC 2019

9th September 2019
Posted By : Alex Lynn
The error detector for signal quality analyser at ECOC 2019

Anritsu announced that visitors to ECOC 2019 will see demonstrations of the brand new 64,2GBaud NRZ / 58,2GBaud PAM4 Error Detector for the MP1900A Signal Quality Analyser-R. The MP1900A series is a high-performance Bit Error Rate Tester (BERT) that accurately measures communications equipment, next-generation high-speed electronic and optical devices, including those for M2M and IoT applications, and optical transceivers used in high-end servers.

The new 64,2GBaud NRZ / 58,2GBaud PAM4 ED card for the MP1900A Signal Quality Analyser-R is an R&D, high-performance Error Detector supporting signal integrity evaluation on high-speed interfaces. The new ED pluggable card offers switchable NRZ and PAM4 signal analysis, high-accuracy Bit and Symbol Error Ratio measurement, world-beating PAM4 Rx Sensitivity, Clock Recovery and Equaliser.

The MP1900A SQA-R platform will be on display on the Anritsu Stand #28, Hall 1 at ECOC, 23rd to 25th September, Dublin, Ireland.

The first demonstration will show the new PAM4 Error Detector card combined with the existing high quality PAM4 Pulse Pattern Generator, to prove key capabilities for signal integrity and compliancy testing towards the latest standards in 200G, 400G and 800G transmission, such as MSB/LSB Bit Error Ratio and PAM4 Symbol Error Ratio, up to 58,2G Clock Recovery, 58,2GBaud PAM4 Receiver Sensitivity down to 36mV, Received Signal Equalisation to compensate the impact of losses from PCBs and cables.

As an additional unique value in the market, MP1900A multichannel signal generation, combined with 25/50/100/200/400G FEC patterns emulation and jitter tolerance testing, enables accurate evaluation of the true performance of optical transceiver modules in real life working conditions.

In a second joint demonstration with Teledyne-LeCroy, the MP1900A SQA-R Platform, ready for PCIe Gen3, Gen4 and Gen5, will be shown in full automatic calibration, Rx/Tx PCIe Device testing, Link Training verification and Jitter Tolerance validation. The stressed signal calibration will be performed on a Teledyne-LeCroy LabMaster oscilloscope with a single SW tool controlling the whole test system.

Visitors to Anritsu’s stand will discover new additions to the wide range of testing solutions for R&D, System Testing & Field Testing:

  • The ME7848A 200 Series Opto-electronic Network Analyser (ONA) combines the VectorStar MS4640B series VNA with the MN4765B O/E detector calibration module and the MN4775A E/O converter to configure a full opto-electronic measurement system of E/O and O/E devices. The ONA system enables error-corrected Transfer Function, Group Delay, and Return Loss measurements of E/O and O/E components and sub-systems.
  • The MP2110A BERTWave, Multichannel BERT and Scope platform, now showcases market unique new features: PAM4 Electrical and Optical Signal Analysis, 26GBaud and 53GBaud PAM4 Optical Signals TDECQ Analysis with Clock Recovery, Integrated Four Channels Optical Scope Simultaneous Independent Testing, Pre-emphasis Auto-tuning for TDECQ Optimisation on Optical signals. At Anritsu stand, this Pre-Emphasis Tuning capability will be demonstrated on a 53GBaud PAM4 optical signal generated by the MP1900A SQA in conjunction with IXBlue’s ModBox-OBand-56Gbaud-PAM4 Reference Transmitter.
  • The 100G Multirate Module for the Network Master™ Pro MT1000A all-in-one tester, which now supports simultaneous dual channel 25G eCPRI/RoE testing. Looking at next generation Mobile FrontHaul networks, the MT1000A Network Master™ Pro now provides new features such as PTP analysis for both G.8275.1 and G.8275.2 standards, and improved accuracy for latency and one way delay measurement, making it the ideal solution for system proving and installation/maintenance of next to come 5G converged wireline/wireless networks, supporting IoT, Automotive and Edge Computing applications.

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