Teradyne and JTAG Technologies in Boundary Scan Product Collaboration

For maximum production test flexibility, two implementations of Symphony are supported by this collaboration. Symphony/TS/CFM incorporates JTAG Technologies' boundary scan controller and TAP Interface Modules inside Teradyne's test system (using Teradyne's flexible Custom Function Board). Symphony/TS/DSM uses a software converter to translate boundary scan test vectors (generated using JTAG Technologies' powerful ProVision development software) directly to Teradyne's native test programming language where they can be applied efficiently using Teradyne's digital subsystem and innovative Deep Serial Memory option.



The Symphony boundary scan solutions are an exciting addition to Teradyne's portfolio of in-circuit boundary scan solutions, said Bobby Griffis, marketing director for Teradyne's Commercial Board Test Group. In addition to supporting a full range of IEEE 1149.1 tests, the Symphony/TS solution has been recently used to successfully diagnose faults on PCBs that are designed with advanced IEEE 1149.6 digital networks.



Our strategic collaboration provides many benefits to the large community of PCB manufacturers who rely on boundary scan and Teradyne test equipment, said Peter van den Eijnden, managing director of JTAG Technologies. These benefits include ongoing support for the latest boundary scan standards, consolidation of test techniques in a single test platform, offline program development and debug capabilities, and boundary scan tests that are transportable throughout the manufacturing enterprise.