Oscilloscopes enhanced for high-speed testing

12th April 2015
Posted By : Mick Elliott
Oscilloscopes enhanced for high-speed testing

Teledyne LeCroy has made significant enhancements to the two high performance oscilloscope product lines in the company’s portfolio. The LabMaster 10 Zi-A delivers improved performance in effective number of bits and baseline noise along with the industry leading jitter measurement floor. The WaveMaster 8 Zi-B features increased sample rate, lower noise, enhanced processing capabilities and the latest version of Teledyne LeCroy’s oscilloscope UI, MAUI.

The LabMaster 10 Zi-A series of real-time oscilloscopes include significant improvements in signal fidelity and noise performance. With these enhancements, Teledyne LeCroy claims industry leadership in jitter measurement floor, while maintaining leadership in bandwidth (100GHz), sample rate (240GHz) and intrinsic (sample clock) jitter (50 fs).

The LabMaster 10 Zi-A’s modular ChannelSync architecture lets users build oscilloscopes with up to 80 channels, with better than 130 fs channel-to-channel jitter — no other oscilloscope can specify this level of performance. Serial data and optical modulation measurement toolkits, including SDAIII-CompleteLinQ and Optical-LinQ provide a rich set of tools for advanced analysis.

A PAM4 analysis package is the first software package available for real-time oscilloscope analysis of systems using PAM4 signaling. These analysis capabilities coupled with the performance enhancements make the LabMaster 10 Zi-A the most capable oscilloscope on the market for engineers designing next-generation high-speed electrical and optical links.

The Teledyne LeCroy WaveMaster 8 Zi-A has established itself as a workhorse oscilloscope platform for the most demanding measurement challenges in high-speed electronics, optical communications, and scientific research.

The updated WaveMaster 8 Zi-B enhances the capabilities of its predecessor with lower noise, higher sampling rates, deeper acquisition memory, and the next generation of Teledyne LeCroy's MAUI oscilloscope user interface.

SDA 8 Zi-B Serial Data Analyser models are specifically configured for testing high-speed electronics systems, with the most advanced eye and jitter analysis toolkit, additional acquisition memory, and a true hardware serial data trigger.

When coupled with Teledyne LeCroy's comprehensive set of standard-specific analysis options, the SDA 8Zi-B is the ideal tool for testing, characterising and debugging USB3.1, PCI Express, DDR memory, MIPI M-PHY and D-PHY, and many other applications.

 

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