Semiconductor Device Test Applications CD from Keithley Semiconductor

The Semiconductor Device Test Applications Guide is divided into six main sections with topics including:
· Two-terminal device tests
· Bipolar transistor tests
· FET tests
· Substrate bias
· High power tests

The Semiconductor Device Test Applications Guide features more than a dozen application notes on topics such as on-the-fly Vth measurements for bias temperature instability characterization, increasing production throughput of multi-pin devices, optimizing switched measurements, white papers on test sequencing instruments and the fundamentals of the LXI communication protocol, six presentations, and an appendix of test scripts.