Test & Measurement

Power analysis options added to R&S oscilloscopes

30th September 2013
Mick Elliott
0

Rohde & Schwarz has added options to its RTO and RTM oscilloscopes covering power analysis and a new differential wideband probe to its portfolio of solutions for clocked power supplies. Developers can automatically perform all major quality analyses and document the measurement results.

The R&S RT ZD10 probe has been developed for the characterisation of switching power supplies with high clock frequencies.  

The high sensitivity and dynamic range of the R&S RTO and R&S RTM oscilloscopes will aid users performing analyses on clocked power supplies . This allows the output ripple of power supplies to be characterised exactly and small voltages or currents in converters to be measured with precision.   

The new R&S RTO-K31 and RTM K-31 power analysis options provide users with specialised measurement functions for automatically testing the quality of all segments of today's switching power supplies – including the mains voltage quality of the input range, the safe operating area (SOA) of the switching transistor as well as the magnitude and spectrum of the output ripple. A measurement wizard guides the user through all measuring steps and provides diagrams illustrating where to connect current probes and other probes to the device under test. The R&S RT-ZF20 power de-skew fixture allows automatic delay correction between the signals of the current probe and the voltage probe. The handy documentation feature helps users manage the measurement results and save the measurement documentation in RTF or PDF format.   

Advanced switching power supplies have ever-higher clock frequencies. The new active differential wideband probe has proven especially useful for characterising these power supplies. The probe combines a high bandwidth of 1GHz and a large input voltage range of 70V DC or 46V AC (peak). The common mode and differential offset compensation can be set separately from each other to increase the flexibility of the measurement.  

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier