Test & Measurement

Oscilloscopes on parade at Embedded World 2014

9th January 2014
Mick Elliott
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Rohde & Schwarz will highlight its growing oscilloscope portfolio at the Embedded World exhibition in Nuremberg (Feb 25-27).  Tailored to the demands of testing and developing electronic circuits, the new models in the R&S RTM family integrate time domain, logic, protocol and frequency analysis in a single device.

R&S RTM-B1 logic analysis option adds 16 logic channels to the RTM. A sampling rate of 5Gs/s and memory depth of 20 Msample allows users to precisely measure long signal sequences.  

The R&S RTM-K31 and R&S RTO K31 power analysis options provide users with specialised measurement functions to automatically test the quality of modern switching power supplies – including the mains voltage quality of the input range and the safe operating area (SOA) of the switching transistor. A wizard guides the user through all measuring steps and provides diagrams illustrating where to connect current probes and other probes to the device under test. During power analysis, users will appreciate the high sensitivity and dynamic range of the R&S RTO and R&S RTM oscilloscopes. These properties allow the output ripple of power supplies to be characterised exactly and small voltages or currents in converters to be measured with precision.      

Jitter measurements are important when developing circuits that have serial high-speed data interfaces such as USB 2.0 or HDMI. The R&S RTO-K12 jitter analysis option offers automatic jitter measurements and a wide range of intelligent functions. For example, a wizard assists users with the most important measurements in order to obtain quick results. One particular challenge when analysing jitter is the signal's embedded clock that is used as a time reference, which is why the option includes configurable software clock data recovery (CDR). The R&S RTO-K13 clock data recovery option provides users with a configurable hardware CDR. For the first time, users can trigger and analyse signals in real time based on the embedded clock. Histograms and mask tests quickly return reliable results.  

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