Test & Measurement

Network analysers fully characterise device under test

19th May 2019
Mick Elliott
0

Reliability and repeatability with excellent dynamic range, trace noise and temperature stability, as well as a wide range of software applications are features of the next generation of network analysers from Keysight Technologies enabling engineers to consistently achieve comprehensive device characterisation.

High-speed digital, wireless, aerospace and defence, and automotive companies need integrated active and passive components for devices such as cell phones, satellite communications, and 5G base stations, to increase performance and reduce size of end products.

These highly integrated devices require test solutions that address radio frequency (RF) test challenges while providing advanced functionality and performance.

Keysight's E5080B, P50xxA Series and M980xA series network analysers deliver next generation features and performance in benchtop, USB, and PXI form factors.

The analysers combine built-in pulse generators and modulators, spectrum analysis, and time domain analysis in a single instrument to save time by fully characterising modern devices without the need for additional test hardware.

Keysight's new E5080B, P50xxA Series, and M980xA Series network analysers, which are available now, enable users to:

  • simplify test setups that can be quickly reconfigured and calibrated
  • reduce number of parts in a test setup, minimising maintenance and downtime costs
  • accelerate test times and improve throughput with a simple, easily automated setup
  • enhance accuracy by eliminating loss from extra connections and external switches
  • customise hardware to easily adapt to future test requirements

The network analysers include the following measurement application software:

  • automatic fixture removal
  • time domain analysis
  • basic pulsed-RF measurements
  • scalar mixer/converter measurements
  • gain compression measurements
  • spectrum analysis

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier