A new capability adds a high-performance spectrum analyser to Keysight Technologies’ PNA and PNA-X Series microwave vector network analysers. It reduces test times by a factor of 10 to 500 times. A new capability adds a high-performance spectrum analyser to the PNA and PNA-X Series microwave vector network analysers. It reduces test times by a factor of 10 to 500 times.
With the new high-performance spectrum analyser capability, a Keysight PNA can perform fast spurious searches across a broad frequency band, improving test throughput by as much as 500 times compared to existing approaches. Measurement results are comparable to those obtained with today’s fastest, most sophisticated standalone spectrum or signal analysers.
The VNA also can perform simultaneous spectrum measurements on all test ports. The capability reduces design cycle time by enabling one-connection characterisation of mixers, converters, amplifiers, modules or subsystems. Example measurements include LO, RF and IF feedthrough; harmonics; intermodulation products; and other higher-order mixing products.
In-fixture and on-wafer measurements gain the benefits of VNA calibration and de-embedding, which correct receiver-response errors and also remove cable and fixture effects. The resulting improvement in test accuracy makes it possible to achieve narrower test margins and tighter device specifications.