Test & Measurement

Award win for Multi-Contact's adjustable test probe

14th July 2011
ES Admin
0
Multi-Contact's adjustable XSAP-4 test probe has won a MessTec & Sensor Masters Award 2011. The probe, which was launched earlier this year, was voted third place in the test and measurement category.
The XSAP-4 complies with the latest IEC/EN 61010-031 standard, which sets out new limits for the maximum length of exposed test probe tips. In categories CAT III and IV the maximum length is 4 mm, while for CAT II probe tips up to 19 mm are permitted.



As the length of the exposed probe tips on the XSAP-4 can be adjusted from a simple 4 mm probe tip to a 19 mm pluggable probe, the probe can be used for categories CAT II, III and IV. This makes it suitable for a large variety of measurement applications and reduces the number of probes needing to be carried.



To alter the length of the tip, the outer part of the handle slides along the inner section and locks into one of two positions. To prevent inadvertent adjustment, the position can only be changed using a separate tool.



The measurement category and rated current for the setting selected are shown in an indicator window.



When extended as a pluggable probe, the XSAP-4 can be plugged into a 4 mm socket with a current rating of 32 A.

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier