Test & Measurement

Agilent Technologies Introduces Compact USB 3.0 Test Setup

2nd November 2009
ES Admin
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Agilent Technologies Inc. today announced it significantly enhanced its SuperSpeed USB test solution portfolio with the introduction of new test fixtures and the support of automated compliance tests and characterization with the new J-BERT N4903B. The new, compact setup will be unveiled at the USB-IF Compliance Workshop in Portland, Ore., Nov. 2-4.
USB 3.0 is an update of the well-established, widespread standard driven by USB Implementers Forum, Inc., a non-profit corporation founded by the group of companies that developed the Universal Serial Bus (USB) specification. USB receiver jitter tolerance testing became mandatory with the recent release of the USB 3.0 specification version 1.0. USB 3.0 is also known as SuperSpeed USB.

Agilent streamlined its USB 3.0 test solution for transmitter and receiver test, now comprised of a DSA91304A Infiniium oscilloscope, a USB 3.0 test fixture, a pattern checker and pattern generator based on the J-BERT N4903B high-performance serial BERT, and the N5990A test automation software platform from Agilent's partner BitifEye Digital Test Solutions. J-BERT's new internal SJ and SSC generation eliminates the need for external signal and noise generators used in the previous test setup.

This live demo of the compact USB 3.0 transmitter and receiver test setup continues Agilent's phased introduction of its USB solution portfolio, said Jim Choate, USB program manager with Agilent's Digital Test Division. With our first solution, introduced earlier this year, we successfully supported early adopters. With this new, compact setup, we are facilitating widespread adoption of USB 3.0 compliance testing.

By supporting J-BERT N4903B High performance Serial BERT, the test automation software N5990A provides even more value to customers, said Alexander Schmitt, co-founder of the Agilent partner company BitifEye. With J-BERT B's built-in jitter sources, system calibration is significantly reduced. This saves customers time and enhances productivity. With J-BERT B and N5990A, test parameters such as the random or sinusoidal jitter can be modified on the fly over a wide range, without the need for calculating and loading synthesized waveforms. This is especially important for characterization and troubleshooting.

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