The LTE TDD Measurement Suite provides LTE TDD chipset, handset and terminal device manufacturers with the advanced test capability they need to rapidly characterize device performance. In conjunction with PXI 3000 RF instrumentation and existing LTE FDD measurement suite, Aeroflex is now able to offer comprehensive RF parametric test capability for LTE devices operating in LTE 3GPP TDD and FDD bands.
The LTE TDD Measurement Suite is able to support all uplink and downlink configurations including special sub-frame configuration as defined in 3GPP 36.211 section 4.2. LTE analysis is supported for uplink (SC-FDMA) transmissions for all bandwidths 1.4 MHz to 20 MHz and modulation types QPSK, QAM16 and QAM64. In addition to numerical measurement results, the measurement suite provides trace displays for spectrum emission mask, CCDF, constellation plots, EVM vs. Carrier and EVM vs. Symbol. EVM analysis for uplink signals is supported for PUSCH, SRS and PUCCH.
The PXI 3000 LTE TDD Measurement Suite has been tested and verified against the Aeroflex TM500 TD-LTE standard test mobile, reflecting Aeroflex’s unique capability in end-to-end testing of LTE TDD from network infrastructure to user equipment. This addition of LTE TDD capability to the PXI 3000 completes Aeroflex’s product offering for this important standard, from R&D right through verification and servicing to manufacturing.
“PXI 3000 is already established as a market leader in testing devices for LTE, as well as across multiple wireless technologies and standards,” commented Tim Carey, product manager at Aeroflex Test Solutions. “Aeroflex is committed to help customers bring LTE TDD devices to market and this latest software option would enable them to use existing modular production test equipment to test devices supporting the 3GPP LTE TDD mode, which are currently under development in readiness for the launch of the first TD-LTE networks in China.”