Test & Measurement

Aeroflex - Multi-handset capability for the TM500 TD-LTE test mobile

22nd July 2009
ES Admin
0
Aeroflex has announced the TM500 TD-LTE Multi-UE, adding a multiple handset (multi-UE) capability to its market-leading test mobile range supporting TD-LTE infrastructure development. The TM500 TD-LTE Multi-UE enables TD-LTE infrastructure equipment vendors to test the performance of their TD-LTE basestations (e-NodeBs) under loaded conditions, accelerating the pace of infrastructure equipment development programmes. At the same time, Aeroflex has announced that it has already won a series of sales contracts for the TM500 TD-LTE Multi-UE.
After network infrastructure functional testing has been completed with a single handset (UE), the next step is to test with a second UE, then a third and so on. System diagnosis is complicated when independent UEs are used, as each UE attempts to interact with the network separately. The TM500 TD-LTE Multi-UE replicates multiple TD-LTE handsets in a single test mobile simplifying complex tasks such as functional network testing with multi-UEs and performance measurement of resource scheduling algorithms. The TM500 TD-LTE Multi-UE can be used to repeatedly generate controlled test scenarios involving a user-defined number of UEs.

“More often than not, multiple UEs do not function as expected against the network compared to a single UE, so it is extremely important to test an eNode-B under loaded conditions,” said Nick Carter, the Aeroflex TM500 Multi-UE Product Manager. “The launch of the TM500 TD-LTE Multi-UE further strengthens Aeroflex’s position as the leading provider of TD-LTE test mobiles, providing infrastructure equipment vendors with an invaluable tool to test loaded operation and performance. Our early sales success shows that we are providing a capability that is very much in demand.”

The TM500 TD-LTE Multi-UE replicates a number of programmable and fully configurable UE’s that are representative of TD-LTE handsets enabling them to measure loaded eNode-B performance before real handsets become available. It provides a controlled, repeatable and deterministic test environment to operate multiple UEs on the same test platform with a single point of control. In addition to functional multi-UE testing, the use of the same test platform enables specific tests that require UE co-ordination and for which it is not practicable to use independent handsets. Such tests include contention between UEs attempting to access the network simultaneously and the ability to check a network’s response if multiple UEs behave unexpectedly or abnormally together. However, each UE still provides TD-LTE functionality with its own independent software stack to ensure that it is representative of a TD-LTE handset. Handset configuration and measurement capabilities are also included to provide infrastructure engineers with the low level UE access and internal UE visibility they require to properly test and debug an eNode-B and network. The TM500 TD-LTE Multi-UE can also be used to measure, optimise and demonstrate functionality such as the resource scheduler performance of an eNode‑B.

“TD-LTE is the Time Division Duplex version of LTE and an evolution of existing Chinese TD-SCDMA technology. It allows the efficient allocation of downlink resources and opens up the unpaired spectrum for LTE,” said Stephen Hire, Director of Marketing for Aeroflex Asia. “With TD-LTE network roll-out scheduled to begin in 2010, the timescale for its deployment is extremely demanding, placing significant pressure on the early availability of feature-rich TD-LTE test equipment to support the ongoing lab and field trials. The TM500’s new TD-LTE multi-UE test capability will help infrastructure equipment vendors fundamentally accelerate their eNode-B development by facilitating the engineering transition from single and multiple UEs through to performance and capacity testing.”

The TM500 TD-LTE Multi-UE capability can co-exist on customers’ existing TM500 LTE equipment protecting their investment and maximising test flexibility.

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier