Test & Measurement
IPETRONIK Offers High-Performance Data Loggers With Twelve CAN-Bus-Measuring Inputs For Automobile Tests
With IPElog, the IPETRONIK-business unit IPEmeasure offers a data logger for particularly high measuring requirements in the mobile data acquisition area. IPElog adds to the successful M-/S-LOG- and FLEETlog-family for consistent further development based on the more than 15 years of experience of IPETRONIK in the field of stand-alone data logger equipment. The new data logger is distinguished by enhanced features and higher performance for dat...
Photo Etched Solutions for High End Automotive Interiors
Precision Micro have recently collaborated with Vestatec Automotive Engineering to bring a number of new interior design possibilities to prestige car manufacturers.
Put smart recording in the driver's seat - Sonoscout NVH Recorder
An intuitive new sound and vibration recorder lets engineers analyse their measurements on the go, using an iPad to manage data and listen to recordings. Using the portable Sonoscout system, engineers can validate recordings in real-time, to remove the risk of recording bad data and then having to repeat expensive testing.
Agilent Enhance MXG And EXG X-Series Vector Signal Generators
Agilent Technologies has announced several key enhancements to its high-performance MXG and cost-effective EXG X-Series vector signal generators. The enhancements are designed to improve measurement accuracy, accelerate research and development, and provide in-depth signal simulation for even the most comprehensive receiver verification.
Agilent Technologies Announces Enhancements to Automate Verizon IMS VoIP Compliance Test Plan
Agilent Technologies today announced enhancements to its N5973A Interactive Functional Test Automation for Verizon Wireless Compliance Test Plans software, including new scripts to automate Verizon's IMS voice-over-IP compliance test plan.
Efficient Suspension Configuration with Virtual Test Benches
dSPACE Automotive Simulation Models (ASM) now support the simulation of virtual test benches for vehicle dynamics analysis. The new ASM Kinematics and Compliance (ASM KnC) provides functions for designing and simulating wheel suspensions on a virtual test bench, thereby opening up a new, innovative application field. Users can now run virtual tests for numerous vehicle variants and driving maneuvers to optimize vehicle suspensions and make them a...
Still Faster with ETAS INCA V7.1, New features and increased system performance accelerate work processes
In the course of its 15 years on the market, the INCA application tool has grown a user base of more than 25,000. One of the major focal points in the development of the tool’s latest release, INCA V7.1, was the improvement of system performance as it relates to the handling of ECU projects featuring a large contingent of measurement and calibration variables.
Rohde & Schwarz User-Friendly Bench Oscilloscopes With Logic Analysis
With the introduction of the new R&S RTM series, Rohde & Schwarz has expanded the functional range of its bench oscilloscopes. The key upgrades are a 20 Msample deep memory and a logic analysis option with 16 digital channels. The smart operating concept of the new R&S RTM models ensures extreme ease of use. The R&S RTM provides time domain, logic, protocol and frequency analysis functions in a single box, making it the ideal instrument for the t...
Simplify Vision Systems With Power Over Ethernet Frame Grabbers
National Instruments has announced the NI PCIe-8236 and NI PCIe-8237R two-port GigE Vision frame grabbers featuring PoE technology. The NI PCIe-8237R features NI LabVIEW FPGA-enabled I/O, including isolated digital inputs and outputs, as well as bidirectional TTL lines for implementing custom counters, PWM signals and quadrature encoder inputs.
Saelig announces the JTAGMaster universal PLD test system
Saelig Company has introduced the JTAGMaster Tester/Programmer, an integrated solution for testing and configuring Programmable Logic Devices. JTAGMaster can perform boundary scan IC and board tests, as well as programming JTAG-compatible IC and EEPROMs using external adapters.