Test & Measurement

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PXI Express High-Speed Instruments and 18-Slot PXI Express Chassis are firsts says NI

National Instruments has announced the industry’s first PXI Express high-speed instruments as well as the industry’s first 18-slot PXI Express chassis. The new modular instruments include the NI PXIe-5122 100 MS/s, 100 MHz dual-channel digitiser and the NI PXIe-6537 and NI PXIe-6536 50 MHz and 25 MHz 32-channel digital I/O modules. The NI PXIe-1065 18-slot chassis offers up to 1 GB/s per-slot dedicated bandwidth and a combination of both PXI and PXI Express slots. The new PXI Express products are ideal for applications such as signal intelligence, spectral monitoring, semiconductor chip characterisation and video test.
22nd May 2007

Digital I/O option allows Oscilloscope and AWG cards to control external equipment

Strategic Test has announced the BaseXIO option for the company’s series of UltraFast Oscilloscope and Arbitrary Wafeform Generator (AWG) cards. The new low-cost option adds eight asynchronous TTL channels to the PCI card. While an additional PC connector panel is provided, OEM’s that integrate the UltraFast card within a larger system can route the digital cables internally for maximum convenience.
22nd May 2007

Software Tests Families of Power Supplies With One Test

Software Tests Families of Power Supplies With One Test
Intepro Systems, announces the availability of Version 3.0 of its Powerstar 5 software featuring improved database integration that allows for testing a complete family of power supplies with a single test program. Powerstar 5 V3.0 significantly cuts test program software (TPS) development and maintenance time by reading test parameters from a user-specified database, engineering design file or even from a marketing spreadsheet. Instead of maintaining large numbers of test programs for each power supply series, the user now needs just one set – which the design engineers can maintain.
21st May 2007


Ultrafast Digital Pattern Generator PCI boards with up to 32 Gigabit on-board memory

Strategic Test has released four new Digital Pattern Generator boards for PC’s with up to 32 Gigabit memory, maximum clock rates of 40 MHz, 10 MHz or 5 MHz, and a choice of 16- or 32-bit widths. Uniquely, each 4-bit can be programmed with a different HIGH and LOW output level from –2 V to +10 V in 10 mV increments. This output range can generate signals compatible with ECL, PECL, TTL, LVDS, LVTTL, CMOS and LVCMOS. Compared to traditional instruments, the UF2-7200 series is less expensive, easier to use and eliminates the need for multiple instruments to produce different signal levels.
18th May 2007

NI TestStand 4.0 Accelerates Test System Development

National Instruments has announced NI TestStand 4.0, the latest version of the company’s test management software designed to help engineers develop and deploy automated validation and manufacturing test systems. The new version of NI TestStand features a streamlined sequence editor that reduces development time and increases ease of use. Engineers can use the new sequence editor to easily reconfigure the NI TestStand development environment to meet the functionality requirements of advanced systems or to facilitate the use of basic software features for new users. With the preconfigured step templates in the new sequence editor, engineers can easily reuse preconfigured test templates to quickly build test sequences and save time in test system development.
15th May 2007

ATE system has digital functional testing

ATE system has digital functional testing
Aeroflex now offers its 5800 Series ATE system with digital functional testing capabilities. Ideal for engineers performing mixed-signal testing, device programming, functional test, in-system programming, or simple protocol communications, the 5800 Series was designed with an open architecture and highly configurable structure that allows it to easily adapt to evolving Printed Circuit Board (PCB) industry standards, providing a versatile solution that can be easily upgraded to satisfy future requirements as they emerge.
14th May 2007

Synchronous Systems with more than 1000 channels

Synchronous Systems with more than 1000 channels
When doing large experiments such as in physics research as well as in production tests, there is often the need to acquire a large number of channels simultaneously. Proprietary systems are often expensive, can only be extended by the components of one manufacturer and in many cases complicated to program. CAMAC (Computer Automated Measurement And Control) based systems are a possible solution though rather intended for more slow acquisition areas. Spectrum, the specialist for PC instrumentation, is going a different way. Their huge range of PC instruments, easy to program under Windows and Linux, is combined with versatile synchronisation options.
14th May 2007

Laser Dichroic Filters

Laser Dichroic Filters
Semrock, Inc has announced a family of filter products made with advanced Ion Beam Sputtering. The new RazorEdge Dichroic beamsplitters, which reflect a standard laser wavelength incident at 45 degrees while efficiently passing a broad band of the longer Raman-shifted wavelengths, boast an ultrasteep transition from reflection to transmission far superior to anything else on the open market. The guaranteed transition from laser line to passband in
11th May 2007

Linux drivers for PC Instrument Boards from Strategic Test

Strategic Test Corp. has announced new and updated Linux drivers for its range of UltraFast Waveform Digitizer, Arbitrary Waveform Generator and fast Digital I/O boards. The new drivers include 64-bit versions for the RedHat, SuSe and Fedora distributions, together with updates for their 32-bit drivers that support kernels 2.4 and 2.6.
10th May 2007

Enhanced RF EMC Test Software Features Latest Test Requirements

Enhanced RF EMC Test Software Features Latest Test Requirements
Teseq, the advanced EMC test solutions supplier (formerly Schaffner Test Systems), announce the availability of the latest enhancements to their market leading “Compliance 3” EMC test software. Teseq first launched their innovative test software in 2000 and the package is under continual development. Continuous improvement is driven by the requirements of ever changing standards, customer feedback and Teseq’s quest to ensure Compliance 3 continues as the de-facto standard software for EMC testing. Teseq has maintained a team of software development, applications support and customer support engineers permanently working to improve and enhance the product’s capabilities and ease of use.
10th May 2007


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