Test & Measurement
Advanced debugging on the menu at Design Developers Conference
German debug tool company Lauterbach will be hosting a half-day workshop entitled, “A Guide to Advanced Debugging” at the design Developers’ Conference series. This workshop will explain and demonstrate how the more advanced debug tools are enabling developers to produce higher performance code, whilst speeding up reliable code development.
RF power meter operates at frequency rnage of 20MHz to 1000MHz
Now available from Link Microtek is a compact RF power amplifier that utilises high-power LDMOS technology to deliver an output of 1kW from an air-cooled 19in. chassis only 5U in height, providing a significant reduction in both size and weight compared with alternative products.
Module meets converged network test requirements
EXFO has unveiled its FTB-8830NGE Power Blazer module. As a test tool for next-generation converged networks its testing capabilities extend to Ethernet, SONET/SDH, OTN, Fibre Channel as well as packet synchronisation (SyncE/1588 PTP). It is designed to meet all the 10G multiservice network testing challenges of today and tomorrow.
High-speed digital symposium tour explores design through verification
Conducted in 10 cities across Europe, from May 20th through to July 3rd, Agilent Technologies has announced a European symposium tour focused on high-speed digital design and test topics. The full-day technology symposium for engineers and project managers is complimentary and will feature presentations from some of the leading providers of FPGA and memory devices.
Disturbance analysis now standard on MXE EMI receiver
Agilent Technologies has added disturbance analyser capabilities as a standard feature of its N9038A MXE EMI receiver. For those who need to make discontinuous-disturbance, or click, measurements, the MXE simplifies and automates data collection, analysis and report generation in accordance with CISPR standards 14-1 (emissions) and 16-1-1 (measurement apparatus and methods).
PCB test and debug event slated for June 18 in Cambridge
The ‘ElectroTestExpo’ consortium has revealed the dates for its regional PCB test and debug exhibitions to be held during 2014. Now enjoying its fifth consecutive year of free-to-attend events, ElectroTestExpo will commence its combination of drop-in tabletop exhibition and seminar on June 18th at one of the UK’s main electronics and research hubs – the Cambridge Science Park (the Trinity Centre).
Network analyser family bolstered by 8.5GHz model
Agilent Technologies has expanded its PNA-X family of network analysers with an 8.5 GHz model that more economically supports lower-frequency devices used in wireless communication applications (e.g., handsets, base stations, WLAN and other mobile communication devices). The new network analyser offers lower cost and frequency to bring advanced measurement capabilities to the cost-sensitive wireless communication device market.
Compact optical test platform offers many connectivity options
EXFO has launched the FTB-2 ProCompact Platform, the industry's smallest platform for high speed, multi-technology and optical testing and the next generation in the FTB line of portable test platforms. The tester delivers a compact solution for high speed and multi-service testing as well as the power to field testing.
Test Debut: Anglia opens new market with Teledyne LeCroy
Anglia Components has taken its first step into the test and measurement distribution space. It has signed a deal covering the UK and Ireland with Teledyne LeCroy. Both companies see fertile ground in the engineering community where Anglia’s field applications team will identify opportunities for Teledyne LeCroy’s oscilloscopes and waveform generators. Anglia will hold an inventory that can be ordered via its Anglia Live website for n...
PXI show offers platform for chassis and digitizer
ADLINK will showcase the PXES-2780 PXI Express Chassis and the PXIe-9852 High-Speed PXI Express Digitizer at The PXI Show (NEC, Birmingham, April 8-10). The ADLINK PXES-2780 is an 18-slot PXI Express chassis, compliant with PXI Express and cPCI Express specifications and offering one system slot, one system timing slot, ten hybrid peripheral slots, and six PXI Express peripheral slots for a wide variety of testing and measurement applications req...