An industry-leading breakthrough in spectrum and signal analysis at millimeter-wave frequencies was unveiled with a flourish by Keysight Technologies at European Microwave Week in London. The N9041B UXA X-series signal analyser is the first to provide frequency coverage to 110GHz with a maximum analysis bandwidth of up to 5GHz.
Developing off-the-shelf tools for extremely high frequencies requires Keysight’s proven blend of measurement science and millimeter-wave expertise. The new signal analyser exemplifies the company’s capabilities with attributes such as advanced front-end circuitry that achieves low loss and efficient mixing, providing a displayed average noise level (DANL) as low as –150 dBm/Hz when characterising wideband modulated signals in the millimeter-wave band.
Mike Gasparian, president, Keysight Communications Solution Group said, “Together with the 802.11ad RF test solution, the UXA adds a new level of insight to millimeter-wave applications such as 5G, 802.11ad and automotive radar, and it is the next step in our program to bring technology above 50 GHz to commercial applications.”
The challenges of designing systems at these frequencies are significant, and this increases the need for integrated tools in design, simulation, measurement and analysis.
Keysight software solutons for design and simulation provide an efficient workflow that accelerates development of next-generation devices and systems.
These tools were used in the development of the N9041B UXA and enabled first-time-correct designs of its millimeter-wave circuits. Keysight engineers also used the company’s industry-leading millimeter-wave measurement tools, including network analysers, oscilloscopes, spectrum analysers, signal generators and associated application software, to fully characterise their devices.
Current applications of these tools include development of 5G wireless communications, millimeter-wave backhaul, satellite communications, automotive radar, military radar and electronic warfare systems.
Emerging applications encompass development of devices and systems capable of performing high-resolution materials measurements for manufacturing, pharmaceutical and medical.