100G-EPON test solution supports OLT and ONU BER measurements

Posted By : Mick Elliott
100G-EPON test solution supports OLT and ONU BER measurements

The Signal Quality Analyser MP1800A Series 100G-EPON Test Solution has been launched by Anritsu. The newly developed 100G-EPON Application Software MX180014A and Signal Quality Analyser MP1800A support BER measurements of OLT (Optical Line Terminal) and ONU (Optical Network Unit) for the latest 100G-EPON standard.

The explosive increase in broadband services supporting 4K/8K video is just one of the many drivers for the expansion of optical access networks using Passive Optical Network (PON).

Such a rapid growth in data traffic is driving the transition of these optical access networks to high-speed 10Gbit/s PON technology, while simultaneously needing to assess the adoption of the next-generation 100G-EPON standard (IEEE802.3ca) offering bit rates of 25Gbit/s per signal.

As a result, the development of OLT and ONU units for PON systems requires both wideband 25Gbit/s performance as well as more precise timing and margin measurements due to the shorter time per bit.

The MP1800A is a plug-in modular Bit Error Rate Tester (BERT) for measuring a wide range of interfaces up to multichannel 64 Gbit/s. The MP1800A signal-source multichannel synchronisation and skew adjustment functions are optimum for OLT tests requiring high-accuracy timing setting.

In addition, high-reproducibility BER measurement is achieved by high-quality output waveforms and high input sensitivity performance.

The MX180014A software controls the MP1800A to generate 2ch test-signal burst patterns and set skew. OLT evaluation input sensitivity and timing tests are made easy by the GUI for setting test-signal pattern length and timing.


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