Test & Measurement

Nordson DAGE at SEMICON West

16th June 2016
Peter Smith

Nordson DAGE is to exhibit at SEMICON West (July 12-14) in San Francisco. Recognised as a leader in X-ray inspection for electronics, Nordson DAGE will show its 4th generation, ultra-high resolution, off-line MXI X-ray system – the Quadra 7 – for the first time in the Americas’.

The Quadra 7 with 0.1μm sub-micron feature recognition comes equipped with two 4K UHD displays and their 8 million pixels to fully show the 50μm pixel pitch and 6.7MP image size of the Aspire FP detector. 4K UHD offers up to 4 times the detail compared to standard HD display screens and supports 68,000X total magnification. Allowing you to see sub-micron level features without losing detail.

With its in-house, proprietary QuadraNT tube, Aspire FP detector, Gensys inspection software and QuadraGen power supply, Nordson DAGE claims the future of X-ray image resolution, reliability, performance and throughput with the new Quadra Series.

Featured products

Upcoming Events

View all events
Newsletter
Latest global electronics news