Test & Measurement

CyberOptics to Showcase MX500- Industry’s First Ever Modular AOI Solution and its newest SPI Dual Lane System at NEPCON South China 2011

8th August 2011
ES Admin

CyberOptics Corporation. a leading SMT inspection solutions provider, will feature the MX500™- fully-modularized AOI system along with its award winning SPI and AOI Inline inspection systems at the upcoming NEPCON South China 2011 scheduled to take place from August 30-September 1, 2011 at the Shenzhen Convention & Exhibition Centre. CyberOptics invites all attendees to visit booth 1C43 for a firsthand demonstration of the innovative inspection solution.

’ SE500-D™ Dual Lane SPI system is designed with largest board handling capability comparable with major SMT suppliers. With its flexible conveyor configuration, SE500-D™ maximizes production utilization by allowing different products with varying board widths to be run on the same production line. SE500-D™ also supports asynchronous inspection on separate lanes.

Also on display, CyberOptics will highlight its simple yet robust 100 percent 3D SPI system ― the SE350™. CyberOptics’ calibration-free sensing technology is at the heart of its SPI product suite, delivering a flexible inspection solution that can inspect even the most demanding assemblies at 80 cm²/second inspection speeds or greater, without compromising on measurement accuracy and repeatability.

MX500™ offers scalability and flexibility for line expansion using an innovative multi-lane approach. It is designed with a horizontal-stackable conveyor system with a primary inspection lane that can be coupled with additional lanes to support dual, triple and quad-lane configurations. It includes CyberOptics’ core inspection sensor design (SIM) and inspection engine (SAM), delivering a high-speed, flexible inspection solution for advanced inspection of solder and lead defects, presence and position, correct parts, and polarity down to 01005 components.

CyberOptics’ innovative, multi-award winning QX500™ AOI system that provides ‘on-the-fly’ area-scanning inspection at an incredible 200 cm²/sec also will be on display at the show,

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