Test & Measurement

Agilent Technologies Enhances High-Speed Serial Interconnect Analysis Software for R&D, Quality Assurance, Manufacturing Test

2nd September 2011
ES Admin
Agilent Technologies Inc,, has announced the latest release of its ENA Option TDR application software, Revision A.01.50. The enhanced software is designed to meet the requirements of the latest high-speed digital standards used in R&D, quality assurance and manufacturing test.
With the increase in bit rates, standards continue to evolve and new measurements are often the result. There is a growing need in the industry for more thorough evaluation of components, as well as evaluation under actual operating conditions.

There are various ways to approach performance enhancements, said Hisao Yamaoka, marketing manager with Agilent's Component Test Division – Kobe. Agilent's approach is to provide continuous improvement on the measurements that our customers care most about. The ENA Option TDR Revision A.01.50 stays true to that heritage.

The enhanced Agilent software delivers the following updates for high-speed digital measurements, enabling users to:

Determine optimal signal conditioning for high-speed digital link with emphasis and equalization features. Simulate emphasis and equalization via a simple GUI.

Perform stressed eye diagram analysis of interconnects with the jitter insertion feature. Impairments such as random and periodic (sinusoidal) jitter can be configured.

Analyze impedance of active devices under actual operating conditions with Hot TDR measurement capability. The spurious frequencies of the transmitter can be determined from the data rate (user input) and avoided during the frequency sweep, allowing for fast and accurate measurements

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