Test & Measurement
Technical Web Seminar from Keithley Teaches the Basics of Low Current Electrical Measurements
Keithley Instruments is hosting a free online seminar in which the company will explore the basics of electrical measurements from nA to fA . The webcast, which will be broadcast on Thursday, 19 November, at 15:00 CET, is free to attend, but registration is required. For detailed seminar information and to register, visit http://www.keithley.info/low-current-webinar.
Agilent Technologies, Nexus Technology Deliver DDR3 Memory Bus Debug Solutions
Agilent Technologies Inc. and Nexus Technology Inc. today made available DDR3-1867 DIMM and DDR3-1600 SODIMM slot interposer test solutions. These test solutions are the ideal tools for designers performing DDR3 DIMM or SODIMM validation, failure analysis, and bus functional-parametric validation in servers, supercomputing, desktops, laptops and computing applications.
Agilent Technologies' Expanded HDMI Test Solution Portfolio on Display at CEA 861/HDCP PlugFest13
Agilent Technologies today announced that its enhanced High-Definition Multimedia Interface (HDMI) test solution portfolio is being demonstrated at the CEA 861/HDCP PlugFest13, Nov. 8-13, in Burlingame, Calif. The expanded solution enables engineers to test the new features introduced by the HDMI Specification 1.4 such as HEAC (HDMI Ethernet and Audio Return Channel) support or 4K x 2K and 3-D video format support. The test solution also increase...
Aeroflex launches complete solution for RF parametric test of wireless subsystems, including LTE
Aeroflex announced today the launch of the 7000 Series Vector Analyzer Generator (VAG), a single, fully integrated RF parametric test system for RF test of wireless components and subsystems. The 7000 Series combines both vector signal generation and vector signal analysis in a single box, providing an integrated approach to measurements for complex wireless standards, including LTE. The instrument features an intuitive touch-screen user interfac...
Tektronix Communications Announces Suite of Network Intelligence Products for Enhanced Performance Monitoring of Next Generation IP Networks
Tektronix Communications, a leading worldwide provider of Network Intelligence and Communications Test Solutions, today unveiled a suite of new Network Intelligence products that effectively collect, correlate and analyze media and signaling data from next-generation IP telecommunication networks, turning data into actionable information that drives better operational and business results. Designed to meet the needs of both legacy and next-gener...
LeCroy introduces first oscilloscope-based decode solution for PCI Express 2.0 and 3.0
LeCroy Corporation’s PCI Express Decode Annotation for LeCroy oscilloscopes provides new capability for hardware and system engineers to simultaneously understand the physical layer and protocol behavior of high-speed PCI Express serial data signals. The new capability provides a link layer protocol decode for up to four PCI Express signals annotated on the oscilloscope physical layer waveform. It is the first and only oscilloscope-based decode...
National Instruments Introduces Video Test Solution for Multimedia Device Testing
National Instruments today introduced NI VideoMASTER 3.0, a new PXI Express-based digital video analyzer for validation and production test of multimedia devices. VideoMASTER simplifies the testing of multimedia devices by using configurable measurement steps within NI TestStand test management software to automate a full suite of video measurements. By taking advantage of the efficient, configurable performance of VideoMASTER 3.0, multimedia tes...
Agilent Technologies Introduces Network Analyzer with Wide Frequency Range
Agilent Technologies Inc. today introduced a compact network analyzer, the Agilent E5061B, that analyzes a frequency range as low as 5 Hz up to the RF (radio frequency) range of 3 GHz. This network analyzer's broad range and versatility eliminates the need for additional low-frequency-dedicated instruments.
Agilent Technologies Introduces Compact USB 3.0 Test Setup
Agilent Technologies Inc. today announced it significantly enhanced its SuperSpeed USB test solution portfolio with the introduction of new test fixtures and the support of automated compliance tests and characterization with the new J-BERT N4903B. The new, compact setup will be unveiled at the USB-IF Compliance Workshop in Portland, Ore., Nov. 2-4.
Synopsys extends DFTMAX compression to reduce the cost of pin-limited test
Synopsys has announced a new capability in DFTMAX compression that significantly reduces the cost of test for designs and methodologies that mandate very few test pins. Extending Synopsys’ patented adaptive scan technology with a high-performance, low-pin interface to the tester allows designers to achieve predictable compression of up to 100X or more with only one pair of test data pins. As designers must maintain test quality and reduce test ...