Test & Measurement
Honeywell and National Instruments Collaborate on Easily Configurable Test and Measurement Systems
Honeywell and National Instruments today announced their collaboration on test and measurement systems that offer plug-and-play compatibility between Honeywell sensors and National Instruments data acquisition instrumentation.
Napatech Brings Intelligence To Network Monitoring
Napatech today announced the availability of unique features that provide visibility into tunnels for network monitoring and analysis of value-added services running over IP, such as VOIP, VPN and mobile data. Napatech’s network adapters have the unique capability to intelligently distribute 10Gbps flows in real-time to up to 32 CPU cores based on Ethernet, IP, MPLS, layer 4 and now GTP, GRE and SCTP tunnel information.
Agilent Technologies Adds Genetic Association and Copy Number Variation Analyses to Bioinformatics Software, Expanding Systems Biology Suite
Agilent Technologies, Inc. introduced GeneSpring GX 11, the latest generation of its popular desktop software for visualizing and analyzing microarray data, and GeneSpring Workgroup 11, the enterprise version of the GeneSpring desktop software.
GL Releases Ultimate Diagnostic Tool for Telecom Networks
GL Communications Inc. announced today the release of a new application Call Data Record – an ultimate diagnostic tool for telecom networks. Addressing a press conference Mr. Vijay Kulkarni, CEO of the company said, “CDR provides comprehensive information on each and every call occurring on T1 E1 lines, including: voice capture for both directions, complete signaling information for each direction for CAS, ISDN, MFC-R2, SS7, all alarms and er...
Agilent Technologies Introduces Universal Testing Machine for Nanomechanical Characterization at 2009 Materials Research Society Meeting
Agilent Technologies Inc today introduced an easy-to-use, enhanced-performance universal testing machine that offers highly accurate nanomechanical characterization capabilities. The Agilent T150 UTM lets researchers investigate dynamic properties of compliant fibers via the largest dynamic range and best resolution on the market -- five orders of magnitude of storage and loss modulus.
Agilent Technologies Introduces Enhanced-Performance Dynamic Contact Module II for Nanomechanical Testing
Agilent Technologies Inc today announced the availability of an enhanced version of its popular Dynamic Contact Module for nanomechanical testing of materials. The Agilent DCM II features 3x higher loading capability (30mN max load); easy tip exchange for quick removal and installation of application-specific tips; and a full 70m range of indenter travel.
NBS adds high speed flying probe to its evolving range of test services
Leading EMS provider NBS has announced the acquisition and installation of a SPEA high speed flying probe test system in its manufacturing facility located in Santa Clara, California. The addition of the SPEA Model 4040 extends the company’s capabilities across the entire range of test and verification technologies. NBS employs a comprehensive test strategy that is a highly integrated part of its unique manufacturing system that successfully ac...
LeCroy - PCI Express Gen 1.x, 2.0 and 3.0 Decode Annotation on Oscilloscopes to Speed Validation and Debug
LeCroy Corporation’s PCI Express Decode Annotation for LeCroy oscilloscopes provides new capability for hardware and system engineers to simultaneously understand the physical layer and protocol behavior of high-speed PCI Express serial data signals. The new capability provides a link layer protocol decode for up to four PCI Express signals annotated on the oscilloscope physical layer waveform. It is the first and only oscilloscope-based decode...
QualiPHY SAS-2 Compliance Testing Software
LeCroy today announced the launch of QualiPHY SAS-2, the first physical layer transmitter compliance test application for SAS-2, the latest generation of the Serial Attached SCSI standard. The release of this software expands LeCroy’s portfolio of QualiPHY automated serial data compliance test solutions, providing automated control for the SDA 8 Zi series of oscilloscopes to test SAS initiators and targets running at 1.5 Gb/s, 3.0 Gb/s and 6.0 ...
High-resolution micro-ohmmeter has increased accuracy
TTi has improved its BS407 micro-ohmmeter by increasing its accuracy at the lowest values of resistance. The BS407 can resolve resistance down to 1 microhm, and has ranges with full scales from 2 milliohms up to 20 kilohms with a basic accuracy of 0.1%. It uses a 4-terminal measurement system via high quality Kelvin clip leads, and has a maximum excitation current of 250 mA. Current reversal can be selected to identify errors from thermal EMF.