Test & Measurement
Tektronix Introduces Fully Automated Test Support for SAS Conformance
Tektronix today announced an automated compliance and test automation solution that now spans both SATA and SAS (Serial Attached SCSI). It encompasses the breadth of SAS conformance tests defined by UNH-IOL and the SCSI Trade Association (STA). Using the latest TekExpress software, storage system designers can complete these tests by simply pressing a single button which ensures accurate and consistent results — saving set-up time and eliminati...
Multi-Tool for R&D testing mobile devices from 7 layers
7 layers has developed a new small and affordable InterLab R&D Multi-Tool. It is ideal for creating an over-the-air test environment for mobile phones without the need for an RF wired connection. The system supports tests such as battery lifetime, data throughput and RF- and acoustic parameter measurements.
National Instruments Releases Enhanced 6.6 GHz PXI Express RF Modular Instruments
National Instruments has introduced two new PXI Express RF modular instruments for automated wireless device test. The NI PXIe-5663E 6.6 GHz vector signal analyser (VSA) and the NI PXIe-5673E 6.6 GHz vector signal generator (VSG) significantly improve automated test times for a wide range of devices that use the latest wireless standards including wireless local area network (WLAN), WiMAX and GSM/EDGE/WCDMA.
Test System Ensures that SERCOS III Slave Implementations from Different Manufacturers are Interoperable
The SERCOS III Slave Conformizer is a powerful test tool for slave devices on the SERCOS III Ethernet-based automation bus. It ensures that SERCOS III slave implementations from different manufacturers are compatible and interoperable.
LeCroy Expands WaveAce Oscilloscope Series to Include 4 channel and 40 MHz Models
LeCroy Corporation today announced that it is expanding the popular WaveAce oscilloscope line to include 4 channel models from 60 MHz to 300 MHz and adding a new 2 channel, 40 MHz model. The 4 channel models provide 10 kpts/ch memory and up to 2 GS/s sample rate; the 40 MHz model provides 4 kpts/ch and a sample rate of up to 500 MS/s.
CellMetric launches 4G LTE eNodeB Test Signal Generator
Cambridge based digital cellular and broadcast company CellMetric announces the launch of a Long Term Evolution (LTE) eNodeB 4G base station test signal generator. CellMetric’s Modus 6 LTE test solution is compliant with Release 8 of the Third Generation Partnership Project standard (3GPP) and supports both Time Domain Duplex (TDD) and Frequency Domain Duplex (FDD) modes. This follows the 11th December 2008 functional freeze of LTE as part of 3...
Verizon Wireless Chooses Spirent For LTE Testing
Verizon Wireless announced today that the company has selected Spirent Communications as a provider of testing solutions for the certification of devices that will operate on the nationwide 4G Long Term Evolution (LTE) network that Verizon Wireless is building on the Upper 700 MHz C-Block spectrum.
Take a trip to Barcelona and learn from the leading experts in LTE test and service monitoring
LTE will for sure be in the spotlight this year at Mobile World Congress February 15-18 in Barcelona. Come visit Anritsu at stand 1B31 to see live LTE testing of devices and networks, and discuss the activities and trends within the testing community.
Spring Launch for new MetPak II Combined Weather Station
April 2010 will see the launch of Gill Instruments’ next generation Combined Weather Station, the MetPak II. Based on the popular MetPak, it has new, improved features including RS232, 422, 485 digital outputs plus additional weather monitoring features such as Barometric pressure and Dew point measurement.
Tektronix SuperSpeed Test Solution Supports World’s First USB 3.0 Certification At NEC Electronics
Tektronix announced that its SuperSpeed USB solution supported the verification of signal quality for NEC Electronics Corporation’s USB 3.0-compatible host controller –the world’s first to obtain USB 3.0 certification from the USB Implementers Forum.