Test & Measurement
Anritsu Expands Measurement Capability of Handheld Spectrum Analyzers to Include Signal Analyzer Functions
Anritsu Company announces it has expanded the test capability of its MS2712E and MS2713E Spectrum Master handheld spectrum analyzers to include signal analyzer capabilities. With the new 10 MHz bandwidth demodulation option, the MS2712E/MS2713E can test and verify the RF quality, modulation quality, and downlink coverage quality for all the major wireless standards, including LTE, WiMAX, WCDMA/HSDPA, TD-SCDMA/HSDPA, CDMA, and GSM/GPRS/EDGE.
Anritsu Introduced AM/FM/PM Spectrum Analysis Capability for Spectrum Master and Site Master Analyzers
Anritsu Company introduced AM/FM/PM analysis capabilities in its MS2712E/MS2713E Spectrum Master and S332E/S362E Site Master analyzers. Specifically meeting the needs of professional broadcast and land mobile radio (LMR) field technicians and engineers, the new option brings the inherent advantages of the industry leading handheld analyzers to professional broadcast and LMR applications.
Agilent Introduced Complete Test Solution for PCI Express 3.0 Featuring the New Digital Test Console
Agilent Technologies introduced its PCIe3.0 test solutions and the new Agilent Digital Test Console. The Digital Test Console is the industry's only complete and integrated x1 through x16 protocol analyzer and exerciser solution for the PCI Express 3.0 specification, currently under development within the PCI-SIG®. The Digital Test Console offers the industry's largest capture buffer and fastest download interface, with multiple non-intrusive pr...
Agilent Technologies' Advanced Design System 2010 to Support Emerging IBIS-AMI Modeling Standard
Agilent Technologies Inc. today announced its support for IBIS-AMI (Algorithmic Modeling Interface) -- a modeling standard for SerDes transceivers created to enable fast, statistically significant analysis of high-speed serial links. Agilent's work in support of this standard is expected to yield the commercial release of a new version of Advanced Design System, ADS 2010, which will allow signal integrity designers to integrate IBIS-AMI models in...
Agilent Technologies - One-Box Solution for High-Speed Serial Interconnect Analysis
Agilent Technologies today introduced the Time Domain Reflectometer (TDR) application software option for the Agilent E5071C ENA network analyzer. The combined E5071C and TDR application software make the ideal one-box solution for high-speed serial interconnect analysis. The E5071C with the TDR option includes three breakthrough features; simple and intuitive operation, fast and accurate measurements, and lower cost of ownership. The one-box sol...
Agilent Technologies' New LXI Data Acquisition Switch Unit Delivers Instant Easy Connectivity and Use Anywhere
Agilent Technologies introduced a data acquisition switch unit that easily connects, configures and acquires data at the bench, on the network or in a remote application. The Agilent 34972A 3-slot LXI Class-C compliant data acquisition switch unit includes a built-in 6 1/2 digit DMM, eight optional plug-in modules, 1 Gb LAN and USB 2.0 ports. This gives engineers involved in R&D and functional test the connectivity options they need, yet it easi...
Agilent Technologies, DeMille Research Inc. to Offer CAD Translation, Test Development Tools for Agilent Medalist In-Circuit Testers
Agilent Technologies Inc. and DeMille Research Inc announced they have signed a value-added reseller agreement that allows Agilent to offer DRI's TestSight Developer software to its Medalist i3070 and Medalist i1000 in-circuit test (ICT) customers.
Byte Paradigm and MTCS to sell test instruments in China
Byte Paradigm (Nivelles, Belgium) and MTCS Systems Engineering (Beijing, China) are pleased to announce that they are starting a collaboration to market Byte Paradigm's PC instrumentation products in China.
Unit test tool allows temporal component testing
The latest version of Tessy, a tool to automate unit / module / integration testing of embedded software, features “temporal component testing” as major enhancement. It allows testing several test objects integrated, under certain circumstances even using simulated time, hence “temporal”.
Economical Aeroflex 3250 Series spectrum analyzers add 8 GHz tracking generator option
The Aeroflex 3250 Series spectrum analyzers now include an optional 8 GHz tracking generator. Ideal for any kind of bench or lab environment, the new 3250 Series tracking generator has a frequency range of 100 kHz to 8 GHz and a level range from 0 dB down to -20 dB. An adjustable output level, with a setting resolution of 0.5 dB, provides additional flexibility when testing the frequency response and compression characteristics of amplifiers, fil...