Test & Measurement
Wind Sensor Technology Displayed at WINDPOWER 2010
Gill Instruments Ltd, a world leader in ultrasonic wind measurement technology, will exhibit their extensive product range at Windpower in Dallas, Texas on 23-26 May 2010. The product range on display will include the new MetPak II combined weather station as well as the popular WindSonic wind sensor, Extreme Weather WindObserver and WindMaster Pro ultrasonic anemometers with a live demonstration of the low-cost WindSonic wind sensor.
Finder digital meters help reduce local energy consumption
Finder has announced a series of digital energy meters for accurately monitoring and measuring electricity consumption in plant and machinery, HVAC, lighting and other environmental control equipment. The DIN rail mounted 7E Series provides users with local, high visibility 7-digit LCD display of total and partial kWh consumed, instantaneous power, voltage and current.
Aeroflex cdma2000/1xEV-DO Measurement Suite for PXI 3000 Series now supports 1xEV-DO Rev B for production testing of mobile terminals
Aeroflex announced today that the PXI 3030 cdma2000/1xEV-DO Measurement Suite now supports Revision B (Rev B) of the standard, at no additional cost to current licensees. This latest upgrade extends the capabilities of the Aeroflex PXI 3000 Series test system to include fast and cost-effective production testing of mobile handsets, components, and chipsets to the new standard revision.
Aeroflex and 7 layers Agreement brings advanced LTE Testing Services to Japanese market
Aeroflex Test Solutions and 7 layers have signed an agreement to provide LTE (long term evolution) testing services in support of the commercialization of LTE mobile phone networks in Japan. Aeroflex will install its 7100 Digital Radio Test Set in 7 layers’ laboratory in Yokohama, Japan, greatly expanding 7 layers’ LTE regulatory compliance testing services.
Elan Digital Launches New SD/SDIO Testing Tool
Elan Digital Systems announces the addition of the SD/SDIO Testing Tool to its range – the SDCT5. This device is intended for designers and manufacturers of SD/SDIO devices and provides a fast and simple method of implementation of controlled command/response analysis.
Measurement Computing Releases New Multifunction Data Acquisition Loggers
Measurement Computing Corporation (MCC) today announced the release of the LGR-5320 series of stand-alone, multifunction data acquisition loggers. The new data acquisition devices allow users to collect high-speed correlated analog and digital data without a computer.
Agilent Technologies Introduces Comprehensive Low-Power DDR2 Compliance and Protocol Test Tools
Agilent just introduced a low-power double data rate 2 (LPDDR2) compliance and protocol test application packages and industry-first LPDDR2 ball-grid array (BGA) probes. In addition to accelerating the turn-on and debug of LPDDR2-based systems, these tools give engineers an efficient way to ensure their LPDDR2 designs will interoperate with other LPDDR2 components.
Agilent Technologies and UC San Diego Collaborate on Chip-Scale Photonic Systems Testing Facility
Agilent Technologies and the University of California, San Diego (UCSD), today announced they have established a new chip-scale micro- and nanophotonic- systems testing facility on the UCSD campus. The new facility is part of the National Science Foundation (NSF) Major Research Instrumentation (MRI) project and is being set up in conjunction with the multi-university Center for Integrated Access Networks (CIAN), led by The University of Arizona.
Agilent Technologies Announces University-Level Engineering Lab Experiments in Latest CD-ROM Series
Agilent Technologies announced the availability of Version 8.0 of its Educator's Corner CD-ROM. The CD contains information on more than 100 ready-made teaching topics, including modulation, phase shift, RF, filters, distortion, amplifier characterization, basic measurements, digital basics and physical measurements. Educators will appreciate the downloadable lab procedures and customizable experiments that can be tailored to fit specific class ...
Agilent Claims World's Fastest Oscilloscope Probing System with 30 GHz Bandwidth
Agilent has introduced the InfiniiMax III oscilloscope probing system with industry-leading bandwidth of 30 GHz. Four new probe amplifier models offer bandwidths from 16 to 30 GHz. A wide range of probe heads allows connection using a browser, ZIF (zero insertion force) tip, 2.92-mm or 3.5-mm SMA cable or solder-in tips. These probing solutions complement the new Infiniium 90000 X- Series oscilloscopes with their industry-leading bandwidth of 32 ...