Test & Measurement
Relocation of TRaC's Southern Labs creates unique Aerospace EMC test facility
TRaC is pleased to announce that in September 2011 it will greatly expand its EMC and Environmental testing facilities in the south of England; TRaC's new location near Wimborne, Dorset, will be a UK centre of excellence for, in particular, all aspects of EMC testing for the Aerospace and Defence industries, and enhancing the established local commercial EMC and Safety facilities currently serving the region.
Thales Alenia Space choose LDS V994 Shaker for Satellite Testing
Brüel & Kjær is to provide Thales Alenia Space with an LDS vibration shaker system for mechanical vibration and shock testing of satellites.
60V Step-Down LED Driver Drives Three Independent LED Strings of 100mA LEDs & Offers 10,000:1 True Color PWM Dimming
Linear Technology announces the LT3597, a 60V, 1MHz, step-down DC/DC converter designed to operate as a three channel, constant current LED driver. Each channel of the LT3597 contains a constant current sink LED driver with a dedicated adaptive-output buck converter.
Rohde & Schwarz signal generator now features DVB-C2 to support all second-generation broadcast standards
Rohde & Schwarz has launched a DVB-C2 software coder for its R&S SFU signal generator. The coder enables manufacturers of broadcast receiver equipment and chipsets to perform standard-compliant tests on their products with DVB-C2 signals. Certification bodies and cable network operators can also use the new option. The R&S SFU already supports all common digital and analog radio and TV standards. Now it can handle all second-generatio...
Agilent Technologies' SystemVue Smashes Validation Barriers for Emerging Wireless Circuit Designs
Agilent Technologies Inc. today announced the release of SystemVue 2011.03, a leading system-level communications design environment. With this release, SystemVue now enables wireless system architects and system-on-chip designers to validate multiband, high-transistor-count wireless IC designs accurately against the latest communications standards.
Agilent Technologies Introduces IV-Curve Tracer Software
Agilent Technologies Inc. (NYSE: A) today announced the Agilent U2942A Parametric Measurement Manager Pro, software designed for basic yet complete DC parametric testing on component devices.
Agilent Technologies' New Waveform Builder Software Makes Creating Custom Waveforms Faster, Simpler
Agilent introduced the BenchLink Waveform Builder Pro, full-featured waveform creation software for its 33200, 33500 and 81100 Series waveform generators. Using the software, R&D engineers characterizing new designs and test system engineers validating production units in the aerospace/defense, semiconductor and wireless communications industries can now more quickly and easily create custom waveforms. They also can gain deeper insight into thei...
Agilent Technologies Introduces Industry's First DisplayPort 1.2 Source Compliance and Validation Software
Agilent announced the industry's first DisplayPort 1.2 source compliance and validation software. The software runs on Agilent's industry-leading Infiniium oscilloscopes and provides the complete compliance test suite for the extensive physical-layer tests required for DisplayPort 1.2 source devices.
Agilent Technologies' New IO Libraries Suite Adds Connectivity to Latest PXI and AXIe Products
Agilent Technologies Inc. (NYSE: A) today released a new version of its IO Libraries Suite software for test instrument connectivity and control. Release 16.1 adds additional support for PXI and AXIe instruments and delivers an improved user experience, making it faster and easier to connect to instruments from a wide range of vendors.
Agilent Technologies Ships Latest IC-CAP Platform for DC and RF Device Characterization and Modeling
Agilent Technologies announced shipment of the latest release of its device modeling software platform, Integrated Circuit Characterization and Analysis Program. IC-CAP 2011.04 provides significant improvements in the modeling flow of semiconductor devices by enabling the IC-CAP Wafer Professional automated measurement solution to link with IC-CAP's CMOS model extraction packages.