Test & Measurement
Epson Announces Two New Inertial Measurement Units for Industry
Seiko Epson has developed two new products, the M-G550-PC and the M-G550-PR, for its inertial measurement unit lineup. The new products will be on show at Sensor + Test 2013, the world's largest international fair for sensors to be held from May 14 to 16 in Nuremburg, Germany.
Mantracourt Launches New Design Strain Gauge to USB Converter
We are pleased to announce the launch of our new redesigned strain gauge to USB converter (DSCUSB). The new design offers a more compact solution, with a smaller and more stylish enclosure. Internally the product remains unchanged and will perform identically to its widely acclaimed predecessor.
Teledyne LeCroy Announces DDR4 Physical Layer Compliance Test Support and DDR4 Lighthouse Partners Program
Teledyne LeCroy announces the addition of DDR4 physical layer compliance test capability through the DDR4 Lighthouse Partners Program. DDR4 developers who are looking to validate their design will benefit from joining the Lighthouse Partners program which provides early access to design validation software.
GOEPEL electronic extends JULIET Desktop Tester to support Embedded System Access
GOEPEL electronic presents a number of new features for its desktop tester series JULIET. The systems now support all Embedded System Access technologies for high-speed in-system programming of Flash, PLD and MCU as well as structural and functional at-speed board test.
LTX-Credence Announces the Selection of the Diamondx Tester by Texas Instruments for Microcontroller Device Testing
LTX-Credence today announced that Texas Instruments has selected the LTX-Credence Diamondx tester as its test solution for Cortex-M microcontrollers in a 65nm process. TI selected the Diamondx based on its proven ability to deliver highly efficient testing of its microcontrollers, thereby substantially lowering test cost without compromising quality.
Yokogawa power meters are key to LUX-TSI EcoDesign Test programmes
Yokogawa power meters and analysers are the key elements in tests being carried out by LUX-TSI. The two companies have entered into a relationship to test products using Yokogawa’s WT210 and WT3000 instruments to evaluate compliance with European Ecodesign Directives, and this capability will be demonstrated at the euroLED Conference at the International Convention Centre, Birmingham, on 24th and 25th June 2013.
New PXI controller for ASSET's ScanWorks platform supports four test technologies
With the new PXI-based controller for ASSET InterTech’s ScanWorks platform for debug, validation and test, engineers can test circuit boards with four different toolsets, each based on a different test technology.
IAR Systems now shipping I-scope probe for real-time current and voltage measurements
IAR Systems today announced that it has started shipping the latest addition to its innovative Power Debugging technology. The I-scope probe extends the power optimization possibilities available in IAR Embedded Workbench.
New Emerson Network Power VPX System Chassis Simplifies Development, Testing and Deployment
At the Design West Expo today, Emerson Network Power today announced its latest VPX system chassis: the KR8-VPX-3-6-1. Designed primarily for development, testing and lab duties, the KR8-VPX-3-6-1 can also be deployed in ground benign installations as it meets Emerson’s standard safety, electromagnetic compatibility and environmental requirements.
LDRA Integration with NI TestStand and NI VeriStand Seamlessly Links Hardware and Software Testing
LDRA has integrated the LDRA tool suite with NI TestStand and NI VeriStand to provide seamless complete systems testing. This integration eliminates many of the manual steps needed to prove system functionality, complete code coverage, and generate documentation. From within the National Instruments tools environments, developers can now fully test their applications with real-world data, saving 25–40 percent of project development time.