Test & Measurement
Advanced Triggering Capability Added to Test Card
Data Device Corporation (DDC) has added enhanced test and simulation functionality to the BU-67210T cPCI/PXI MIL-STD-1553 test card. In addition to variable output voltage, variable intermessage gap time, and error injection, it now offers enhanced triggering capability that can be used to trigger external devices in real time based on user defined events, making it a highly adaptable solution for production test labs.
Livingston Offers Calibration Solution For SMEs
Test equipment sourcing specialist Livingston is to rent calibrators from its inventory allowing their customers to calibrate their test equipment. Livingston says that for smaller companies, involved in installation work or serving the industrial space, it is often hard to justify the heavy investment needed for acquiring calibration equipment, as the stock of test instrumentation being held is not enough to ensure regular utilisation of the cal...
Specific Sound Source Analysis For The Road Ahead
'Before-and-after' results show the difference Source Path Contribution (SPC) makes by quickly finding the contributions, from specific components, to the Noise Vibration Harshness (NVH) experienced by the driver and the significance of the NVH path.
Multi-Site Testing Solution Targets Mobile Power-Management ICs
Advantest has entered the market for testing system-on-chip (SoC) mobile power-management ICs (PMIC) using the V93000 platform. Compatible with Advantest’s base of V93000 systems, the new solution can perform multi-site testing of complex SoC devices and single in-line packages (SiP) with embedded power-management cores.
Anritsu unveil the MS2027C and MS2037C
The MS2027C and MS2037C, the latest two members of the VNA Master handheld vector network analyzer family have been introduced by Anritsu. The new VNA Masters are ideal for demanding field use environments, including aerospace and defense, Satellite Communications, commercial wireless backhaul, and research.
Epson Adds 48-pin QFN Package to S2R72A4 Series of Hub Controller ICs for Automotive Applications
Seiko Epson Corporation has begun shipping a new addition to its S2R72A4 series USB hub controller ICs for automotive applications. The series, which is engineered to operate in an industry-leading temperature range from -40 to 105 degrees Celsius, now includes a 48-pin QFN package with a 40% smaller footprint and height.
PC-Based Oscilloscope Competes on Price, Portability
The PicoScope 9300 Series Sampling Oscilloscopes can perform pre-compliance tests, fault-finding, design, debug and margin testing on serial communications signals such as 10 Gb Ethernet, SONET/SDH STM64 and FEC1071, 10x Fibre Channel, and InfiniBand and PCI Express. These two-channel oscilloscopes will replace traditional, full-sized bench-top instruments without compromising on usability, analysis features or accuracy.
Toshiba Launches World’s Largest Capacity Automotive-Grade HDDs
Toshiba Electronics Europe has launched a new series of automotive-grade hard disk drives (HDDs) to meet the increasingly demanding storage needs of the automotive sector. The MQ01AAD032C is the flagship model and houses 320GB[1] of storage in a 2.5 inch (6.4cm) HDD casing. The MQ01AADxxxC range also consists of the MQ01AAD020C (200GB) and the MQ01AAD010C (100GB) HDDs.
Free Seminar Tackles Curve Tracing Challenges in Power Semiconductors
Keithley Instruments is to offer a free, web-based seminar titled “Testing Modern Power Semiconductor Devices Requires a Modern Curve Tracer.” This event, which is available for on-demand viewing, will discuss the curve tracing challenges posed by today’s power semiconductor devices and will teach viewers how to perform both I-V and high voltage C-V measurements with a modern parametric curve tracer.
Probe Overcomes Flat Blade Connector Contact Problem
The new P762/G from Peak Test Services is a test probe specifically designed for applications requiring high-current contacting with flat blade connectors. The new probe overcomes the difficulties previously encountered in contacting flat blade connectors with high currents, which result from the fact that the front face does not provide enough contact surface area.