Design

Win a Microchip J-32 Debug Probe!

15th June 2020
Lanna Deamer
0

Here at Electronic Specifier we have teamed up with Microchip to give our readers the chance to win a Microchip J-32 Debug Probe (DV164232) and if you don’t win, receive a 20% off voucher, plus free shipping for one of these products.

The J-32 Debug Probe Debugger/Programmer provides affordable, fast and easy debugging and programming for Microchip’s PIC32 and SAM MCU and MPU products.

J-32 Debug Probe is fully integrated into Microchip’s powerful MPLAB X Integrated Development Environment and easy-to-use Integrated Programming Environment. Connecting existing hardware is simple as it keeps the SEGGER J-Link/J-Trace 20-pin debugging connector. The J-32 Debug Probe has all the necessary performance and features 32-bit MCU and MPU developers need.

From SEGGER, the J-32 also benefits from many of the following advanced software utilities, many of which are free:

  • SystemView (V2.x) provides run time recording and captures tasks, interrupts, timers, API calls and user events and provides live analysis of captured information.
  • J-Scope application displays run time data of multiple variables in an oscilloscope format. Simply connect the J-32 Debug Probe to your target, program and start J-Scope. Each variable can be individually manipulated with familiar oscilloscope controls and features.
  • Remote Server allows the J-32 Debug Probe to debug from anywhere in the world. This is especially useful when your software expert needs to resolve development or product issues in another region.
  • J-Mem permits direct RAM and Special Function Register (SFR) modifications without a bulky Integrated Development Environment (IDE). Memory can be displayed in an 8-, 16- or 32-bit format and can be exported to a .bin file. J-Mem is compatible with Windows, macOS and Linux operating systems.

For your chance to win a Microchip J-32 Debug Probeor receive a 20% off voucher, including free shipping, click here and enter your details in the online entry form.

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