Design

ASSET demonstrates ScanWorks’ non-intrusive validation and test capabilities at Embedded World

9th February 2011
ES Admin
0
At the upcoming Embedded World Exhibition and Conference March 1-3 in Nuremberg, Germany, ASSET InterTech (Hall 9, Stand 277) will be offering hands-on demonstrations of non-intrusive board test (NBT) and validation strategies running on its ScanWorks platform for embedded instruments.
The software-based ScanWorks platform validates, tests and debugs chips, circuit boards and systems with several non-intrusive technologies, including the following:



The new Internal JTAG (IEEE P1687 IJTAG) standard for embedded instruments which is expected to be ratified later this year. ASSET recently introduced the first toolset for this new standard. IJTAG defines an interface for embedded instruments so they can be easily accessed, their operations automated and their outputs fully analyzed. It also enables portable test routines that can be re-used throughout a product’s life cycle.



· Processor-controlled test (PCT) is able to take control of a circuit board’s processor and assert functional and structural tests on all addressable devices and buses on the board.



· BIST technologies such as Intel® IBIST (Interconnect Built-In Self Test), which is embedded in Intel®’s Sandy Bridge processors. ScanWorks is able to take advantage of IBIST to validate the performance and operation of high-speed buses on designs based on Sandy Bridge and other Intel processors. The buses ScanWorks is able to validate include QuickPath Interconnect (QPI), the DDR3 bus, PCI Express (PCIe) and Direct Memory Interface (DMI).



· Boundary scan (IEEE 1149.1 JTAG) tools for performing structural tests on circuit boards.



The non-intrusive validation, test and debug tools on ScanWorks avoid the shortcomings of older test technologies that rely on physically probing chips and circuit boards. Many factors such as the increasing speeds of processors and the serial buses on circuit boards are rapidly diminishing the test coverage and validation effectiveness of legacy probe-based test and measurement technologies.

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier