IR’s RAD-Hard Ultra-Low Drop Out Voltage Regulators Provide High Density Solution for Power-Restricted High Reliability Applications

Leveraging its extensive heritage in the military and space market sectors, IR has developed an innovative control IC and bypass transistor for the new ULDO family, resulting in significant performance improvements over alternative solutions, making them well suited for use in power-restricted applications requiring high density.

The space level screened devices, designed for point-of-load and post DC-DC power conversion, offer a low dropout voltage of only 0.4 V at full 3 A load. The new regulators feature a Silicon On Insulator (SOI) CMOS Regulator IC, latch-up and SEU immunity, as well as outstanding TID and ELDRS testing in excess of 100 Krad with negligible effect on regulation tolerance. In addition, the devices provide fast transient response, timed latch-off over-current protection and internal thermal protection, and on/off control via shutdown pin.

The new ULDO devices’ adjustable regulators provide output voltages as low as 0.8 V compatible with the newer FPGA used in space equipment.