MIRTEC's New AOI Series Wins a Prestigious Industry Award

27th April 2012
ES Admin
MIRTEC announces that it has been awarded the 2012 EM Asia Innovation Award in the category of Test & Measurement / Inspection Systems – AOI for its revolutionary MV-9 3D AOI Series. The award was presented to the company during an April 26, 2012 ceremony in Shanghai during NEPCON China 2012. Established in 2006, the EM Asia Innovation Awards program recognizes top performing companies for achieving the highest standards in the various manufacturing-related products, materials and equipment in Asia.
The new MV-9 AOI machines are configured with MIRTEC’s exclusive 15 Mega Pixel ISIS Vision System. This revolutionary optics system is comprised of a 15 Mega Pixel Top-Down Camera and a Precision Telecentric Compound Lens. This proprietary vision system is designed and manufactured by MIRTEC for use with its complete product range of inspection equipment. ISIS is an acronym for Infinitely Scalable Imaging Sensor. As the name implies, the resolution of the ISIS Vision System may be scaled or modified to address the specific inspection requirements of virtually any production environment without sacrificing speed or performance.

MIRTEC’s revolutionary Omni-Vision 3D Inspection System provides true 3D inspection of SMT devices on finished PCB assemblies using a total of four (4) Digital Multi Frequency Moiré Inspection Probes. This proprietary system yields precise height measurement used to detect lifted component and lifted lead defects as well as solder volume post reflow. Fully configured, the new MIRTEC MV-9 machines also feature four 10 Mega Pixel Side-View Cameras in addition to the 15 Mega Pixel Top-Down Camera.

Brian D’Amico, President of MIRTEC’s North American Sales and Service Division stated: We are very proud to receive the 2012 EM Asia Innovation Award on behalf of MIRTEC’s extremely talented engineering team for their outstanding performance in the design and development of our new MV-9 3D AOI Series. We are confident that this Advanced Technology will not only provide unprecedented speed and performance to the electronics inspection industry, but will undoubtedly set a new standard by which all other inspection equipment will be measured.”

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