So, what are S-parameters anyway?

16th July 2019
Posted By : Alex Lynn
So, what are S-parameters anyway?

Modern high-speed analogue-to-digital converters (ADCs) have enabled the direct sampling of radio frequency (RF) signals, which in many cases eliminates the need for mixing stages while increasing system flexibility and capability. Traditionally, ADC signal and clock inputs have been represented by lumped element models. 

However, for RF sampling converters, this approach is inadequate, since operating frequencies have increased to the point where a distributed representation is required.

In this three-part series, David Guidry of Texas Instruments explains how to use scattering parameters, also known as S-parameters, in the design of direct RF sampling architectures.

S-parameters provide a framework for describing networks based on the ratio of incident and reflected microwaves. This is useful for circuit design, because you can use these ratios to calculate properties such as input impedance, frequency response and isolation. It’s not necessary to know the details of the network, since it’s possible to directly measure S-parameters with a vector network analyser (VNA).

To read the full article from Texas Instruments, click here.


You must be logged in to comment

Write a comment

No comments




Sign up to view our publications

Sign up

Sign up to view our downloads

Sign up

Connected World Summit 2019
22nd October 2019
United Kingdom The Business Design Centre, London
Hotspots Specials 2019
24th October 2019
Germany Böblingen, Germany
IoT Solutions World Congress 2019
29th October 2019
Spain Barcelona
Maintec 2019
30th October 2019
United Kingdom NEC, Birmingham
NOAH Conference 2019
30th October 2019
United Kingdom Old Billingsgate, London