Evaluation module demos high speed DAC performance

26th June 2016
Posted By : Mick Elliott
Evaluation module demos high speed DAC performance

The new ADC32RF45 EVM evaluation module from Texas Instruments (TI) demonstrates the performance of a dual 3-GSPS 14-bit ADC32RF45 analogue-to-digital converter (ADC) with the JESD204B interface is available at Mouser Electronics. The ADC32RF45 EVM allows design engineers to design smaller, higher-performance radar, software-defined radio (SDR), test and measurement, aerospace and defense, wireless communications, and radio astronomy equipment.

The evaluation module provides a robust environment for engineers to evaluate the upcoming ADC32RF45 ADC. The ADC32RF45 EVM includes the ADC32RF45 ADC, an onboard LMK04828 clock conditioner, transformer-coupled analog inputs, and easy-to-use software GUI and USB interface.

The dual-channel ADC enables direct conversion of RF signals up to 4GHz in the 1st, 2nd and 3rd Nyquist zones, giving designers access to the highest dynamic range and input bandwidth of any 14-bit device.

With industry-leading noise spectral density of -155 dBFS/Hz and superior noise performance of 58.5dB signal-to-noise ratio (SNR) at 1.8 GHz input frequency, the ADC32RF45 ADC allows detection of even the weakest signals.

Designers can also use the multi-band digital down converter capability (DDC) per ADC channel to extract one or two sub-bands per channel, dramatically reducing the digital interface data throughput up to 92 percent and saving system size, power and processing resources.

The ADS54J45 EVM is designed to work seamlessly with TI’s TSW14J56 EVM JESD204B data capture and pattern generator card, through the High Speed Data Converter Pro (HSDC Pro) software tool for high-speed data converter evaluation.

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