MCU allows designers nonvolatile memory on single device

17th October 2018
Posted By : Lanna Cooper
MCU allows designers nonvolatile memory on single device

 

The Piccolo TMS320F28004x (F28004x) is a powerful 32-bit floating-point microcontroller unit (MCU) that lets designers incorporate crucial control peripherals, differentiated analogue, and nonvolatile memory on a single device.

The real time control subsystem is based on TI’s 32-bit C28x CPU, which provides 100MHz of signal processing performance. The C28x CPU is further boosted by the new TMU extended instruction set, which enables fast execution of algorithms with trigonometric operations commonly found in transforms and torque loop calculations; and the VCU-I extended instruction set, which reduces the latency for complex math operations commonly found in encoded applications.

The CLA allows significant offloading of common tasks from the main C28x CPU. The CLA is an independent 32-bit floating-point math accelerator that executes in parallel with the CPU. Additionally, the CLA has its own dedicated memory resources and it can directly access the key peripherals that are required in a typical control system. Support of a subset of ANSI C is standard, as are key features like hardware breakpoints and hardware task-switching.

The F28004x supports up to 256KB (128KW) of flash memory divided into two 128KB (64KW) banks, which enables programming and execution in parallel. Up to 100KB (50KW) of on-chip SRAM is also available in blocks of 4KB (2KW) and 16KB (8KW) for efficient system partitioning. Flash ECC, SRAM ECC/parity, and dual-zone security are also supported.

High performance analogue blocks are integrated on the F28004x MCU to further enable system consolidation. Three separate 12-bit ADCs provide precise and efficient management of multiple analogue signals, which ultimately boosts system throughput. Seven PGAs on the analogue front end enable on-chip voltage scaling before conversion. Seven analogue comparator modules provide continuous monitoring of input voltage levels for trip conditions.

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