It has been announced by the British Institute of Non-Destructive Testing (BINDT), that registration for the Thirteenth International Conference on Condition Monitoring and Machinery Failure Prevention Technologies (CM2016 / MFPT2016), being organised in co-operation and partnership with the US Society for MFPT, is now open.
The combination of the efforts of two leading organisations creates the largest event of its kind at a truly international level and builds on the highly successful series of twelve international CM conferences organised by BINDT and 70 annual conferences organised by the Society for MFPT.
The event will take place from 10th-12th October 2016 at the Novotel Paris Sud, Porte de Charenton, Paris, France, located just ten minutes from Gare de Lyon, the lively Bastille district and with easy access to the main Parisian monuments: Place de la Concorde, Opéra and Eiffel Tower.
The conference will provide attendees with a unique opportunity to network with academics and industrialists from all over the world. Leading figures in the field of condition monitoring will be presenting at the conference, with the very latest developments in the fields of CM and MFPT being revealed, ensuring all attendees will learn something.
There will be four sessions running in parallel covering a wide range of advances in CM fields, which will include:
BINDT has always recognised the importance of encouraging students to participate in this major international event. As a gesture to celebrate the thirteenth international conference in Paris, the Institute will be providing generous sponsorship of student registrations in 2016, resulting in a major reduction in fees for student attendance.
An exhibition comprising around ten sector specialist companies will take place alongside the conference and will provide an ideal opportunity to gain an insight into the up-to-date technologies currently available.
For registration follow this website.