PXI RTD simulator makes its bow at electronica

12th September 2018
Posted By : Mick Elliott

A range of products designed to increase test efficiency and productivity will be featured by Pickering Interfaces at electronica in Munich, Germany (November 13 - 16). Making its debut will be a high-accuracy PXI RTD simulator. The 40-263 is a cost-effective method of simulating PT100, PT500 or PT1000 RTDs from -150°C to >850°C.

The unit supports 4, 8, 12, 16, 20 or 24 channels in one or two PXI slots.

Also, channels may be set as short- or open-circuit to simulate faulty wiring to a sensor. The module is available with the following resistance ranges: 40Ω to 900Ω for PT100 simulation; 200Ω to 4500Ω for PT500 simulation; and 400Ω to 9000Ω for PT1000 simulation. Control is simple, using resistance calls.

PXI & PCI high-density precision programmable resistor modules (40-298 & 50-298) provide a simple solution for applications requiring accurate simulation of resistive sensors.

Units are available in a variety of resistance ranges from 2Ω to 22MΩ and with resolutions to 0.125Ω (±0.2%) to meet the needs of functional test systems. 

Applications include engine controller testing where resistive sensors provide information such as temperature. The modules’ channels are able to be set as short- or open-circuit to simulate a wiring or sensor fault. Software control is simplified by the use of resistor value calls.

The module determines the channel setting closest to the requested value and sets that value. The user can interrogate the module to find the actual resistance setting used by the module.

The new 60-106 six-slot modular USB/LXI chassis offers a small 1U rack-height form factor, making it ideal for space-restricted rack-mount applications. The chassis supports between one and six of Pickering’s 3U PXI Switch and Simulation modules; possible systems include switching matrices up to 3312 crosspoints (three 40-560 BRIC2 modules occupying the three pairs of slots) or up to 108 channels of programmable resistor/sensor emulation (six 40-295 18-channel resistor modules occupying six slots).

USB 2.0 Hub (model 42-738) is a single-slot 3U PXIe module that combines an 8-port USB 2.0 hub and USB data/power switching to provide a controlled connection between the PXIe chassis backplane and USB products.

Each port can connect and disconnect the power and data paths separately, simulating various connection faults. The module can be used to connect a USB device under test or USB test equipment to the test system without reliance on the controller’s USB ports, eliminating the need for freestanding powered hubs in a test system.

It also provides a simple way of expanding the range of test equipment supported by PXI-based test systems to include USB power meters, USB data acquisition systems and USB scopes.

Primarily designed for the simulation of fault conditions in automotive and avionics applications involving the reliability testing of safety critical controllers, the 22-channel PXI Fault Insertion Switch (40-202) can insert three different fault conditions – open-circuit, short-circuit between UUT connections and short-circuit to other signals such as Power, Ignition & Ground - between the test fixture and the equipment under test.

The high-density modular LXI Ethernet scalable reed relay matrix (65-2xx) can be easily configured by the insertion of up to six LXI plug-in modules to matrix sizes of 1536x4, 768x8, 384x16 or 192x32.

Cooling, which is adaptive to minimise acoustic noise where possible, is provided by fans at the rear of the unit, ensuring no space is wasted when the chassis is rack mounted.

In partnership with VX Instruments of Germany, Pickering will be demonstrating VX Instruments’ PXM7820 high-speed multi-measurement device operating in an LXI Ethernet environment through our 2-Slot USB/LXI Modular Chassis (model 60-104).  The PXM7820 features a 16-bit DMM, 16-bit digitiser, counter/timer, and a high voltage input circuitry.  The addition of the PXM7820 allows all of Pickering’s USB/LXI Modular chassis to perform measurements as well as controlling switching in a single chassis.

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