A wide-range of test and measurement products and solutions will be showcased by Tektronix at PCIM 2019 in Nuremberg (May 7-9) including the SiC MOSFET and GaNFET Switching Power Converter Analysis Kit. Tektronix experts will also be on hand to discuss the latest power test solutions from Tektronix.
The Tektronix stand will feature four dedicated power workstations and will include hands-on demonstrations focused on Power Conversion: Wideband Gap Measurement Solutions; Power Efficiency: Managing Always-On Power Demands; Power Integrity: Solutions for Embedded Systems; and Characterisation of Power Semiconductor Devices: IV High Power Testing Solutions.
An SiC MOSFET and GaN FET switching power converter analysis kit will be on parade in Nuremberg. Ultra-fast power semiconductor switching technology such as SiC or GaN that make up some of today’s power electronics topologies, are extremely difficult to optimize. This analysis kit includes patented probe technology to accurately characterise all the critical parameters for optimising power electronics topologies that use SiC and GaN.
With a low-noise, in-house designed ASIC at its heart, Tektronix’ 6 Series MSO mixed signal oscilloscopes advances the performance threshold of mid-range oscilloscopes to 8GHz and delivers a 25GS/s sample rate simultaneously on all 4 channels, allowing engineers working on faster, more complex embedded system designs to accurately view up to four high-speed signals at one time.
With usability and upgradeability at its forefront, coupled with advanced measurements capability and new probing technologies, the 6 Series MSO really delivers measurement confidence.
Power rail probes on show are optimised for power integrity measurements.
They combine low noise contribution, DC offset up to 60V, high bandwidth (up to 4GHz), low loading and a wide range of connectivity alternatives. They target power integrity and validation engineers looking at AC artefacts on DC power rails.