“Commercial vs. Hi-Rel Qualification Method Comparison”
AVX has today revealed that it will be delivering a presentation at the 2013 Microelectronics Reliability & Qualification Working Meeting. December 10-11, 2013 at The Aerospace Corporation in El Segundo, California, MRQW 2013 is a forum for the open discussion of reliability and qualification issues for microelectronics intended for use in space applications.
The AVX presentation, entitled "Commercial vs. Hi-Rel Qualification Method Comparison”, will be given by AVX Fellow Ron Demcko at 10:30am on Tuesday, December 10, 2013. Ron will take the opportunity to address the differences between commercial and high-reliability capacitor design, processing, and qualification for space systems. He will also be giving attendees updated information about base metal electrode testing and reliability for an array of capacitors with varying case sizes, voltages, and values. This supports the recent European Space Agency decision to allow the companies responsible for building its space systems to purchase and employ high-reliability BME capacitors from AVX in their designs.
Since the introduction of base metal electrode technology 20 years ago, AVX has become the market leader in BME reliability. Companies like AVX have optimised BME dielectrics, metals, and processing in order to develop BME components that are just as reliable as precious metal electrode components.
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