Cloud-based test service on parade at electronica

7th November 2018
Posted By : Mick Elliott

Measurement tools and solutions for automotive, communications and consumer devices will be showcased by Advantest at electronica in Munich, Germany (13-16 November). Visitors will be able to attend demonstrations of the on-demand CloudTesting Service, and see the latest capabilities of its EVA100 analogue/mixed-signal IC Test solution and theV93000 A-Class SoC test system for device engineering and production, as well as its HA7300 stimulus test cell for differential pressure sensors.

The CloudTesting Service allows users to access various test method IP selections on Advantest’s web site whenever needed. Using this on-demand online service, designers can verify their new silicon at a very low cost with no capital investment, set up their own test environments within a few hours and be ready to test when the device arrives from the fab.

With free tester leasing and minimum maintenance costs, Advantest’s CloudTesting Service allows customers to avoid unplanned expenses.

The EVA100 measurement system is an analogue/mixed-signal test solution that combines a modular architecture with high-voltage and high-precision analog parametric measurement units, providing the flexibility to conduct various measurements over a broad range of analog and mixed-signal devices. 

The versatile, small-footprint EVA100 tester is easy to use for device characterization through volume production.  The scalable architecture can be quickly reconfigured to address a varied product portfolio and achieve lower cost benefits from economies of scale.

Also on display will be Advantest’s HA7300 stimulus test cell, a full capability solution for the testing of differential pressure sensors which are becoming prevalent in modern automobile designs focused on better fuel economy and green technologies.

It delivers high-speed, highly precise test temperature control with a proprietary technology that utilises a heat or cold plate to control the temperature of the sensors under test.

On the floor, Advantest’s V93000 A-Class SoC test system will represent the V93000 platform of scalable test solutions which combine the industry’s highest speed digital test, precision analog and RF measurement into a single test system.

With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Because of its high integration and decentralised resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change.

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