Key enhancements to XJTAG v3.8 will be demonstrated by XJTAG at electronica in Munich (November 13-16). Visually targeted debugging will now be available with Waveform Viewer. While Waveform Viewer has previously given insight into circuit behaviour in XJAnalyser, it is now available with XJDeveloper, for an improved debugging experience.
Pin values which are read or driven in XJEase can be displayed in XJTAG’s Waveform Viewer. This offers a new way to visualise what the test system is doing and how it is picking up any errors that it finds.
The detailed waveform of key pin values displayed in Waveform Viewer not only helps debug development code, but can be compared with datasheet timing diagrams.
As a result, it is easy to diagnose defects and pinpoint where errors are coming from.
The Layout Viewer now has faster load times – project files can be opened quicker and navigation is smoother. Visual resolution is sharper, which helps engineers target potential faults quickly.
An added bonus is file size efficiency. The size of the XJPack files (which contain Layout Viewer information) has been reduced, and there is still the ability to open older, larger XJPack files.
Test coverage can be better understood, as it is tracked back to its source more accurately. XJDeveloper now shows the direct impact of enabling or disabling one or more tests.
The current test coverage of a particular project can be compared with its potential test coverage. Therefore, it is possible to find out where coverage may need to be extended, which is critical information for achieving the best test coverage.
A new feature is XJTAG’s ability to assess defect coverage using the PCOLA/SOQ industry-standard approach to reporting.
With XJTAG v3.8, not only programmers, but hardware engineers can easily visualise circuit behaviour using Waveform Viewer. They can save time by pin-pointing faults with extra detail, intuitively navigating across Layout Viewer and assessing test coverage accurately.
XJTAG v3.8 now gives a smarter and faster test development experience where there is more control over the handling and presentation of test data.