Design

Reducing EMI radiated emissions with Smart Gate Drive

3rd December 2018
Alex Lynn
0

Radiated emissions testing for electromagnetic interference (EMI) can reveal issues that send engineers back to the drawing board to revise their product. Design revisions and additional test time increase product costs and delay schedules while engineers debug and solve EMI issues. 

Smart Gate Drive technology in TI motor drivers helps customers solve their radiated EMI issues without costly board revisions or extra test time. With selectable IDRIVE currents for driving external FETs, EMI emissions from the motor-driver section of a system can be minimised by a simple serial interface (SPI) command or resistor change. 

Radiated EMI from FET driving With any motor system that uses gate drivers and external FETs, designers must balance the tradeoff between FET switching time and EMI emissions. Typically designers want FET switching time to be as fast as possible to minimise power losses due to FET switching. However, fast switching time can also cause the parasitic components around the FET to ring and to radiate EMI.

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