Design

JTAG Functional Test (JFT) bends the Fault Coverage Curve

21st September 2009
ES Admin
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JTAG Technologies has launched JTAG Function Test (JFT), which bridges the gap between standard structural boundary-scan testing and functional verification. As a complement to JTAG’s existing vector-based cluster test generators, JFT makes use of an open-source programming language to give test designers the ability to verify quickly the functionality of non-boundary-scan devices and device ‘clusters’.
Available as a plug-in module to JTAG Technologies’ award-winning ProVision tool, JFT is the first product to emerge from boundary-scan technology that uses a recognised open-source programming language to simplify the testing of mixed signal parts such as ADCs and DACs. JFT also eases the testing of parts that require user intervention, or looping test patterns to set-up device registers etc.

JFT utilises the Python programming language plus key underlying boundary-scan resources - such as BSDL files and design netlists - to present users with a powerful command and control environment for easy access to device I/O pins. In addition, the comprehensive functions available in Python support the rapid construction of sequential logic tests – essential for functional verification.

James Stanbridge, JTAG Technologies’ Sales Manager UK, comments: “Before now, engineers have often needed to write custom test firmware to create these types of test, firmware that is often not re-usable across projects. Test preparation has been lengthy and results interpretation equally troublesome. Within JFT however test modules can be quickly prepared using a built-in Python editor and re-used across designs. JFT also includes a number of sample or template modules for cluster devices and their associated functional tests.”
Using Python module programming in combination with ProVision’s connection database means that device test code can be written solely from the functional [test] cluster perspective. Also, a ‘bind model’ feature supports the easy re-use of cluster tests by automatically mapping device-under-test pins to active boundary-scan pins
Stanbridge notes: “While the creation of functional-style tests has always been possible via boundary-scan, with compressed project timescale now the norm there are considerable advantages associated with working at a higher level of abstraction. By utilising a language such as Python, which is already popular within the scientific community, we feel that this offers an advantage over proprietary test languages.
Engineers tend towards well-supported standards, which is another reason why we chose Python.”

In addition to the inclusion of templates, other time-saving features within JFT include automatic completion lists and the display of available Python functional parameters within the tooltip.

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