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Tektronix

  • 14150 SW Karl Braun Drive P.O. Box 500 Beaverton
    OR 97077
    United States of America
  • 503-260-1169
  • http://www.tek.com

Tektronix Articles

Displaying 341 - 360 of 368
Test & Measurement
15th July 2009
Tektronix and National Instruments to Unveil Joint Product Initiative at NIWeek

Tektronix and National Instruments today announced that the two companies have extended their more than 20-year relationship by unveiling plans to co-innovate on new products that will improve productivity and lower costs for engineers and scientists working in design verification, manufacturing test, scientific research, and embedded test. The two companies will unveil specific details at NIWeek 2009 scheduled for Aug. 4–6 in Austin, Texas.

Test & Measurement
20th April 2009
Tektronix Collaborates With Ravensbourne College To Help Engineers of Tomorrow

Tektronix has announced today that they have donated a WVR6100 waveform rasterizer to Ravensbourne College of Design and Communication. The WVR6100 unit, which was presented in person by Tektronix, features analog and SD monitoring capabilities as well as digital audio monitoring functionality.

Test & Measurement
17th April 2009
Tektronix Addresses Test & Measurement Challenges with DesignInsight Mobile Expo

Tektronix has announced the start of its DesignInsight Mobile Expo tour across the US and Canada. The tour is a unique program that brings state-of-the-art Tektronix equipment to engineers at their workplace, allowing hands-on learning and evaluation opportunities that would previously have only been possible with costly travel and time away from the office. Beginning with visits to customer sites in the San Francisco Bay Area on April 20th, the...

Test & Measurement
15th April 2009
Tektronix Introduces Highest Performing, Most Versatile 40GbE and 100GbE Test Solution

Tektronix, Inc announced new optical sampling oscilloscope modules for the Tektronix DSA8200 Digital Serial Analyzer Series that promise to lower the cost of high-performance optical transmitter development and standards compliance. The 80C10B and 80C10B with Option F1 (80C10B F1) provide the industry’s most complete testing solution for compliance verification of next generation transmitter standards from 40 Gb/s to 100 Gb/s and beyond. The co...

Analysis
15th April 2009
Marshall Electronics Turns to Tektronix for 3Gb/s Monitor Design Validation and Test

Tektronix Inc announced that Marshall Electronics, a leading manufacturer of LCD camera-top and rack mountable monitors, has turned to a Tektronix WFM7120 Waveform Monitor and a TG700 Video Signal Generator with an HD3G7 module for design validation and characterization in the development of the industry’s first 3Gb/s serial digital interface (SDI) LCD monitors.

Test & Measurement
19th January 2009
Tektronix Expands TriMode Probe Series

Tektronix has announced new offerings of its active differential probes that complement the full portfolio of new DPO/DSA70000B Series real-time oscilloscopes also announced today. The expanded P7500 probing family now offers performance probes for 4, 6 and 8 GHz in addition to the previously available industry setting benchmark ultra-performance probes at 13, 16 and 20 GHz – all providing superior signal fidelity with fast rise time, low circ...

Test & Measurement
19th January 2009
Tektronix Claims World’s Fastest Oscilloscopes Enhanced for 3rd Generation Serial Data Analysis

Tektronix has announced availability of the high-performance DPO70000B Digital Phosphor Oscilloscope (DPO) and DSA70000B Digital Serial Analyzer (DSA) Series. Already said to offer the highest available bandwidth for real-time oscilloscopes, and with an industry-best jitter noise floor, the new “B” models now also claim the best vertical noise performance, flattest frequency response, and greatest effective number of bits (ENOB). Adding to ...

Test & Measurement
20th November 2008
Tips from Tektronix for Probing Memory

Tektronix has announced several new probe tips with signal bandwidths to 8 GHz including high temperature applications for the P7500 Series TriMode Differential Probe. The new tips are designed specifically for probing DDR2 and DDR3 memory DIMMs and are also useful for general purpose probing applications. The new accessories use socket cable technology for quick and easy attachment. The new TriMode tips provide improved usability and lower co...

Test & Measurement
19th November 2008
Tektronix Key To Wireless USB Testing At Testronic Laboratories

Tektronix has announced that its UWB WiMedia compliance test solution has been selected by Testronic Laboratories, a leading test and certification center, to provide Wireless USB interoperability testing.

Test & Measurement
18th November 2008
Tektronix Claims Industry-Best Oscilloscopes at Entry-Level Price for Mixed Signal Designs

Tektronix has announced its MSO2000 Mixed Signal and DPO2000 Digital Phosphor oscilloscopes which look to provide powerful tools to simplify the debug of mixed signal designs including Wave Inspector search and navigation tools, automatic decoding of serial data busses, unique FilterVu variable low pass filters to reduce unwanted noise from signals, all in a portable, affordable package.

Test & Measurement
13th November 2008
Tektronix Provides Choice for Serial Data Link Analysis

Tektronix has announced new Serial Data Link Analysis (SDLA) Software for the DSA70000 real-time oscilloscope series to fully test high-speed serial data designs such as SATA 6 Gb/s, SuperSpeed USB, 6 Gb/s SAS and PCI-Express 3.0, from the transmitter through the receiver. The new SDLA software builds on the Tektronix history of providing link analysis and S-parameter tools for precise silicon designs with the DSA8200 sampling oscilloscopes. Wi...

Test & Measurement
12th November 2008
High Performance Logic Analyzer Module from Tektronix

Tektronix has announced the new 136-channel TLA7BC4 Logic Analyzer module for the Tektronix TLA7012 portable and TLA7016 benchtop series. The new module complements recently introduced TLA7BBx modules. With 20 ps (50 GS/s) timing resolution and up 128 Mb record length, the new TLA7BC4 module is ideal for a range of state-of-the art embedded applications including DDR3-1600 and MIPI as well as leading edge computer applications such as Intel’s ...

Analysis
5th November 2008
Tektronix Recognizes Achievements of Partners in Europe, Middle East and Africa

Tektronix has recognized several partners in EMEA (Europe, Middle East and Africa) as part of its Partner Excellence Awards programme for Tektronix’ fiscal year 2008. Conducted annually, this programme acknowledges and recognises partners exhibiting outstanding commitment to technical expertise, marketing, service and support and partners demonstrating strong business growth.

Test & Measurement
28th October 2008
Tektronix SignalVu Analyzes RF Signals Up to 20 GHz Bandwidth

Tektronix has announced SignalVu vector signal analysis software for DPO7000 and DPO/DSA70000 digital oscilloscope series, enabling engineers to easily characterize and validate wideband and microwave spectral events.

Test & Measurement
14th October 2008
Tektronix Announces Test Tools for SuperSpeed USB

Tektronix has announced a comprehensive test set for the USB 3.0 specification. The high-speed serial data offering will enable customers to rapidly test their SuperSpeed USB designs.

Test & Measurement
13th October 2008
Philips Test Center Adopts Tektronix for HDMI

Tektronix has announced that the new Philips High-Definition Multimedia Interface (HDMI) Authorized Testing Center (ATC) in Bangalore, India has adopted the Tektronix HDMI V1.3b1 Compliance Test Solution (CTS). The adoption of Tektronix HDMI compliance test solution by Philips, one of the key founders of HDMI, reinforces Tektronix leadership for high-speed serial data and HDMI test solutions.

Test & Measurement
30th September 2008
Tektronix Provides First Published Test Procedure for SATA Revision 3.0 Physical Layer Tests

Tektronix has announced availability of the first published test procedures for physical layer testing of the Serial ATA Revision 3.0 standard. Tektronix provides a comprehensive high-speed serial data test suite for the SATA physical layer design and debug.

Test & Measurement
25th September 2008
PulseCore Semiconductor Taps Tektronix USB Serial Test Suite

Tektronix has announced that PulseCore Semiconductor has successfully used a full suite of Tektronix test instrumentation to test and validate its recently announced USB 2.0 integrated circuit. The new PulseCore IC is the first in the industry to use spread spectrum clocking (SSC) to reduce electromagnetic interference while achieving USB 2.0 industry compliance.

Test & Measurement
18th August 2008
Tektronix oscilloscopes help IZT to overcome signal integrity challenges

Tektronix has announced that the Innovationszentrum für Telekommunikationstechnik GmbH (IZT), a German manufacturer of advanced digital signal processing (DSP) technologies, has selected its DSA70000 and DPO7000 high-performance Digital Phosphor Oscilloscopes (DPOs) and P7313 Z-Active probes for testing advanced telecommunications systems that employ high-speed serial buses.

Test & Measurement
13th August 2008
Tektronix Accelerates Arbitrary Waveform Generators

Tektronix has announced the new AWG7000B and AWG5000B Series of Arbitrary Waveform Generators (AWG). The AWG B series provides a 20% performance boost over many of the prior AWG instruments and continues to be the world’s fastest and most capable family of AWG’s, designed to meet the test needs for high-speed serial data buses and wideband RF applications. With 9.6 GHz effective RF output, 10 bit resolution, and sample rates up to 24 GS/s, ...

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