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Tektronix Articles

Displaying 341 - 353 of 353
Test & Measurement
13th October 2008
Philips Test Center Adopts Tektronix for HDMI

Tektronix has announced that the new Philips High-Definition Multimedia Interface (HDMI) Authorized Testing Center (ATC) in Bangalore, India has adopted the Tektronix HDMI V1.3b1 Compliance Test Solution (CTS). The adoption of Tektronix HDMI compliance test solution by Philips, one of the key founders of HDMI, reinforces Tektronix leadership for high-speed serial data and HDMI test solutions.

Test & Measurement
30th September 2008
Tektronix Provides First Published Test Procedure for SATA Revision 3.0 Physical Layer Tests

Tektronix has announced availability of the first published test procedures for physical layer testing of the Serial ATA Revision 3.0 standard. Tektronix provides a comprehensive high-speed serial data test suite for the SATA physical layer design and debug.

Test & Measurement
25th September 2008
PulseCore Semiconductor Taps Tektronix USB Serial Test Suite

Tektronix has announced that PulseCore Semiconductor has successfully used a full suite of Tektronix test instrumentation to test and validate its recently announced USB 2.0 integrated circuit. The new PulseCore IC is the first in the industry to use spread spectrum clocking (SSC) to reduce electromagnetic interference while achieving USB 2.0 industry compliance.

Test & Measurement
18th August 2008
Tektronix oscilloscopes help IZT to overcome signal integrity challenges

Tektronix has announced that the Innovationszentrum für Telekommunikationstechnik GmbH (IZT), a German manufacturer of advanced digital signal processing (DSP) technologies, has selected its DSA70000 and DPO7000 high-performance Digital Phosphor Oscilloscopes (DPOs) and P7313 Z-Active probes for testing advanced telecommunications systems that employ high-speed serial buses.

Test & Measurement
13th August 2008
Tektronix Accelerates Arbitrary Waveform Generators

Tektronix has announced the new AWG7000B and AWG5000B Series of Arbitrary Waveform Generators (AWG). The AWG B series provides a 20% performance boost over many of the prior AWG instruments and continues to be the world’s fastest and most capable family of AWG’s, designed to meet the test needs for high-speed serial data buses and wideband RF applications. With 9.6 GHz effective RF output, 10 bit resolution, and sample rates up to 24 GS/s, ...

1st May 2008
Tektronix and LitePoint Team Up to Support Latest LTE Standard

Tektronix, Inc and LitePoint Corporation, a provider of wireless test system solutions, announced their collaborative solution to LTE product development. LitePoint’s RSALTE software is designed to run on Tektronix RSA3000A/B and RSA6100A real-time spectrum analyzers, and offers 3.9G compliance support for designers of UMTS-Long-Term Evolution (LTE) systems.

Test & Measurement
2nd October 2007
Tektronix Software Performs Serial Data Link Analysis

Tektronix has announced an end-to-end high speed serial data analysis software package with test capabilities extending from a transmitter to a receiver and including the connecting channel. The new 80SJNB Advanced software runs on the Tektronix DSA8200 Digital Serial Analyzer. 80SJNB Advanced combined with the DSA8200 platform’s TDR/TDT and S-Parameter support through iConnect software provides engineers with the first complete Serial Data L...

Test & Measurement
27th June 2007
Tektronix Tests 20 Gb/s Throughput Infiniband Cable from Intel

Tektronix has announced that it has successfully validated the performance of the new Intel 100 meter Infiniband cable operating at speeds up to 20 Gb/s. The world’s longest InfiniBand optical cable has an electrical interface on either end and uses four serial data lanes at 5 Gb/s each. The cable will be useful in accelerating the performance of large computing clusters. The cables will be used as the part of the backbone network at the Int...

Test & Measurement
5th February 2007
Active differential 'scope probes provide 13 and 16 GHz Bandwidth

Tektronix has announced what it says are the the world’s fastest active differential probes to complement its new four-channel real-time oscilloscopes featured elsewhere in electronicspecifier. The new P7500 probing family sets industry benchmarks for bandwidth, provides superior signal fidelity with fast risetime and low circuit loading, introduces unique patent-pending TriMode measurement switching, and a new “needle nose” form factor. T...

Test & Measurement
5th February 2007
Tek's latest Oscilloscope offers 20 GHz real-time bandwidth and 50 GS/s simultaneous sampling rate

Tektronix has announced the introduction of an ultra-high performance oscilloscope with 20 GHz real-time bandwidth and 50 GS/s simultaneous sampling rate. The DSA70000 Digital Serial Analyzer (DSA) oscilloscope family includes several new models – 20 GHz DSA72004, 16 GHz DSA71604 and 12.5 GHz DSA71254.

Test & Measurement
25th November 2006
Latest Tektronix test set finds and solves WiMAX design problems

Tektronix has announced its RSA-IQWIMAX demodulation and analysis software, part of a comprehensive test set to find and solve WiMAX design problems. RSA-IQWIMAX software is a new application specific test tool for characterizing and troubleshooting WiMAX device designs utilizing a Tektronix RSA3408A Real-Time Spectrum Analyzer and is the result of a partnership between Tektronix and LitePoint. With RSA-IQWIMAX and the RSA3408A, engineering tea...

Test & Measurement
2nd September 2006
6 GHz Active Differential Probe Provides Excellent Signal Fidelity and Connectivity

Tektronix has announced the extension of the Z-Active family of differential probes with the immediate availability of its 6 GHz P7360 Active Differential Probe. This is a continuation of the Z-Active architecture that enhances usability, connectivity, and cost-effectiveness across a broad range of applications and will be useful for digital design engineers working with high speed signals and serial data at rates from 1.5 Gb/s to 3.125 Gb/s.

Test & Measurement
31st August 2006
Tektronix Oscilloscopes Improved

Tektronix, Inc has announced the availability of the TDS1000B and TDS2000B Series of digital storage oscilloscopes. With up to 200 MHz bandwidth, 2 GS/s maximum sample rate per channel, USB flash and device ports, and the industry’s first lifetime warranty, the 2- and 4-channel TDS1000B and TDS2000B Series oscilloscopes are designed to simplify configuration, testing and documentation for design and test engineers and are said to offer unprec...

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