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Multitest elektronische Systeme GmbH

  • Aeussere Oberaustrasse 4
    83026 Rosenheim
    Germany
  • +49-(0)8031-406 0
  • www.multitest.com
  • +49-(0)8031-426 81

Multitest elektronische Systeme GmbH Articles

Displaying 81 - 98 of 98
Test & Measurement
10th June 2011
Optimizing for Test Cell Throughput: Multitest’s MT2168 Fully Leverages Advanced Tester Capabilities

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its MT2168 is designed for best tester utilization. Short index time (DUT exchange time), fast loading and sorting, and a high soak capacity support the handler to keep pace with the new tester generation.

Test & Measurement
1st June 2011
Test in Carriers: New Customer for the Multitest InCarrier

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, is pleased to announce that it has received another order for unique InCarrier® test equipment from a major test house in Asia. The InCarrier® was preferred against standard singulated package test as well as other methods of high parallel test.

Test & Measurement
1st June 2011
Multitest to Hold Open House during SEMICON West 2011

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that it will hold an Open House during the upcoming SEMICON West exhibition at its Santa Clara, CA facility located at 3021 Kenneth Street. The Open House will be open daily July 12-14, 2011 from 10 a.m.-4 p.m.

Test & Measurement
18th May 2011
Save Cost Without Sacrificing Flexibility: The scalable design of Multitest’s MT2168 secures investment for the future

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that the scalable design of the MT2168 allows users to adjust the base unit configuration to the actual requirements – not only at the initial installation, but also later, e.g. if the MT2168 is moved from engineering to a high-volume site.

Test & Measurement
13th May 2011
Optimize Test Cell Setup with Multitest’s Plug&Yield: A case study about an RF / tri-temp application

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, offers Plug&Yield®, a unique offering that comprises much more than other so-called “turnkey” solutions.

Test & Measurement
6th May 2011
Manage Power Dissipation During Test: Multitest’s MT9510 Provides Extended Temperature Control with XTC

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that the MT9510 now provides extended temperature control with its extended temperature calibration (XTC).

Test & Measurement
20th April 2011
Proven Best Cost of Test: Multitest’s ECON Contactor Exceeds 4.5 mio Insertions

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its well-established ECON contactor once again has proven its superior cost of test. The contactor recently exceeded 4.5 mio insertions at an Asian test house.

Test & Measurement
6th April 2011
Multitest Provides Reliable Innovation for Next Generation Burn-in Test

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its burn-in product team recently successfully supported an international IDM to significantly increase its burn-in capacity by more than one third, while substantially reducing the cost and effort required for incoming board inspection at the customer’s ...

Pending
31st March 2011
Sigurd Corporation Chooses Multitest’s MT2168

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, congratulates Sigurd Microelectronics Corporation (Sigurd) for being the first user of the innovative MT2168 pick-and-place handler in volume production in Taiwan.

Pending
21st March 2011
Optimizing Test Yield: Multitest’s MT2168 Ensures Best Positioning Accuracy

Multitest announces that its MT2168 pick-and-place handler offers significant yield advantages based on its unique and industry-leading positioning concept.

Pending
2nd March 2011
Designed for Best Production Flow: Multitest’sMT2168 Shows Best Jam Performance in the Field

Multitest is pleased to announce that its MT2168 has proven its high production performance in the field. Best jam rate statistics are evidence of the successful new design concept.

Test & Measurement
24th February 2011
Multitest Announces Innovative InCarrier for Test in Trays Is Valued by the Industry

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, has received its fifth full purchase order for its InCarrier® device transfer system with InStrip® test handling system adapted to metal frame-based carriers.

Test & Measurement
9th February 2011
Multitest Engineers to Hold Tutorial during BiTS 2011

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Ryan Satrom, RF Engineer, and Jason Mroczkowski, RF Engineering and Product Manager, will hold a tutorial titled “Signal and Power Integrity in the Test Interface” at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 ...

Test & Measurement
7th February 2011
Multitest’s MT9510 is the Leader in Stability and Accuracy

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its MT9510 tri-temp pick-and place handler -–has once again proven its capability in temperature, accuracy and stability.

Pending
3rd February 2011
Multitest Experts to Present PCB Pad Wear Analysis Findings at BiTS 2011

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Valts Treibergs, R&D Engineering Manager, and Chris Cuda, US Product Manager, will present “PCB Pad Wear Analysis at 0.4 mm Pitch ― the Story Continues…” at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 at ...

Test & Measurement
21st January 2011
Multitest’s MT2168 Flexible Contact Sites Offer Benefits in Cost, Utilization and RF Applications

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that the MT2168 features an open, non-standardized contact site architecture, allowing the user to fully leverage the advantages without compromising yield or throughput. The available site pitch kits make a fast and easy contact site change in the field possibl...

Analysis
21st January 2011
Multitest’s DURA Kelvin Recognized with a 2010 Global Technology Award

Multitest announces that it has been awarded a Global Technology Award in the category of Components for its DURA Kelvin. The award was presented to the company during a ceremony that took place during SMTA International at the Walt Disney World Swan and Dolphin Resort in Orlando, FL.

Test & Measurement
25th November 2010
Multitest Develops Innovative LCR Concept for Cost Efficient, High-Performance Test Interface Boards

Multitest’s board division has successfully introduced a new LCR (layer count reduction) concept for high pin count BGA applications. Board customers now will benefit from significant cost savings without sacrificing performance. With the new LCR concept, the layer count of standard pitch BGA boards can be reduced by up to 40 percent.

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