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Multitest elektronische Systeme GmbH

Multitest elektronische Systeme GmbH Articles

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Test & Measurement
16th May 2012
Multitest’s Bowl Feed Option for the MT9928 Is Well Accepted by the Market

Multitest announces a new bowl feed module for the MT9928 xm gravity test handler. This option offers a state-of-the-art solution for temperature test of the smallest devices such as MLF2 and SOT. While Turret is the traditional handling solution, it does not apply when accurate temperature testing is required at hot or cold.

Test & Measurement
4th May 2012
Multitest ecoAmp: New Kelvin Contactor for High-Power Applications

Multitest have announced the debut of its latest Kelvin contactor — a state-of-the-art solution for high-power applications of 500+ Amperes. Current market requirements are driven by energy efficiency, energy harvesting, green energy application, mobility and more. Typically, this application can be found for MOSFET, drivers, IGBT, power modules, and power packages such as TO, SO and DIP.

Test & Measurement
19th April 2012
MT9928 Gravity Feed Test Handler – Multitest Ships its 1800th Conversion Kit

Multitest announces that it recently shipped the 1,800th conversion kit for its MT9928 xm highly modular gravity feed test handler. This clearly demonstrates the broad coverage of applications required by the market and the excellent acceptance of the MT9928 xm. Handled packages range from SO, TO to QFN and DIL/DIP.

Test & Measurement
11th April 2012
Multitest InStrip — Continuously growing installed base: Reliable high parallel handling solution for a broad range of applications

Multitest announces that the InStrip provides a high parallel test handling solution not only for ASICS and sensors in strips, but also for the test of singulated devices. This is accomplished with the InCarrier concept. Based on this broad bandwidth of applications, the number of systems installed in Asia, Europe and the United States is constantly increasing and Multitest is gaining market share.

Test & Measurement
27th March 2012
Multitest’s Offers Comprehensive Tutorial for Kelvin Contactors

Multitest used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that it now offers a Kelvin Tutorial. A Kelvin contactor is required for economical testing of devices with measurements that are sensitive to contact resistance. A true Kelvin contactor completely eliminates contact-resistance errors from DC parametric tests.

Test & Measurement
12th March 2012
Multitest Leverages MT9510x16 for Quad-Site MEMS Applications

Multitest announces that it has expanded its MEMS portfolio to pick-and-place applications with the introduction of its test and calibration cart for the MT9510. Multitest MEMS solutions now are available for strip test and singulated package test–on Multitest InStrip with optional InCarrier,the well-established gravity test handlers MT93xx and MT9928, or the MT9510XP tri-temp pick-and-place handler.

Test & Measurement
5th March 2012
Multitest Launches Optimal Contactor for High-End Digital Applications

Multitest recently launched the newest member of the Quad Tech contactor family: the Triton contactor for high-end digital applications. The Triton responds to the dedicated needs of these digital applications, which include servers, computers, mobile smartphones, digital TV and graphics.

Test & Measurement
16th February 2012
Increase PCB Lifetime by up to 100 Percent — Multitest’s DuraPad significantly reduces pad wear

Multitest announces that its proprietary DuraPad surface has been proven to significantly reduce the effects of pad wear caused by pogo pin style contactors. Specifically, fine-pitch boards of 0.5 mm or below and boards for resistance sensitive testing are particularly vulnerable to pad wear. DuraPad brings substantial cost of test savings to high-volume production sites of array packages and WLSCPs.

Analysis
9th February 2012
Multitest’s Engineering Expert to Present Breaking Research at BiTS 2012

Multitest announces that Ryan Satrom, RF Engineer, will present a paper titled “Improving Power Delivery In The Test Interface” at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 4-7, 2012 Mesa, AZ.

Analysis
7th February 2012
Multitest’s Product Manager to Discuss Specmanship at BiTS 2012

Multites announces that Jim Brandes, Product Manager, will hold a presentation titled “Specmanship” at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 4-7, 2012 Mesa, AZ.

Analysis
6th February 2012
Multitest to Exhibit New Test Solutions at BiTS 2012

Multitest will exhibit its leading test solutions at the upcoming Burn-In & Test Strategies Workshop, scheduled to take place March 4-7, 2012 in Mesa, AZ.

Test & Measurement
3rd February 2012
Multitest Ships First MT9510 x16

Multites announces the first shipment of its new tri-temp 16-site pick-and-place platform. The MT9510 x16 will be deployed at an Asian high volume test site. Based on the technology of the well-established MT95XX platform, the MT9510 x16 leverages Multitest’s expertise in temperature testing and DUT handling to support the state-of-the-art high parallel test for the complete temperature range from -55 to +175°C.

Analysis
12th January 2012
Multitest MEMS Test and Calibration Equipment Now Available for MT9510 Pick-and-Place Test Handler

Multitest has shipped the first Multitest MEMS equipment for the MT9510 pick-and-place test handler to an IDM in the United States. This new combination is based on the two well-established platforms: MT MEMS and MT9510.

Analysis
5th January 2012
Multitest’s UltraFlat Process Meets Requirements of High Parallel Vertical Probe Card Applications

Multitest announces that its UltraFlat process meets the requirements of high parallel vertical probe card applications. For applications such as DDR3 memory, the requirements for the flatness of boards at wafer-level testing become crucial. For optimizing MLO/MLC attachments and contact element interfaces, a better surface is needed. Additionally, flatter PCBs require less compliance from the probe interface and reduce interface wear.

Analysis
19th December 2011
Multitest Offers MT Pro Support Program

Multitest introduces the MT Pro Support Program for complete after-sales support. The MT Pro Support Program encompasses the complete after-sales support services offered by the company. Currently, the program includes the Recommended Spare Parts Lists, the Top-X List and the Preventive Maintenance Kit Program.

Analysis
12th December 2011
Multitest’s 2012 Training Schedule is Now Available

Multitest announces that its 2012 training schedule is now available online. Multitest’s training courses are designed to familiarize the trainee as easily and quickly as possible with the most important features of the test handlers.

Analysis
5th December 2011
Multitest Appoints New VP of Global Sales & Marketing

Multitest have announced that James Quinn was named Vice President of Global Sales & Marketing effective November 14, 2011. Based in Rosenheim, Quinn will be responsible for managing customer relationships throughout the global market. He will direct efforts in the service and application engineering areas to support Multitest’s customers through a network of direct and indirect channels.

Analysis
22nd November 2011
Multitest’s Gemini Kelvin Is the Contactor of Choice for QFNs and BGAs

Multitest announces that the usage of its Gemini Kelvin is rapidly increasing at two longstanding customers, both of which rank among the top 25 IDMs. As more and more functionality is continuously being integrated into devices, there is an increasing need for Kelvin connections. The challenge of landing two independent probes on targets that are becoming smaller has increased. Nevertheless, Kelvin contacting often is the only way to achieve hig...

Analysis
10th November 2011
Multitest Offers Leading Cantilever Technology for All Handler Brands

Multitest announces that its Cantilever style contactors often are used on non-Multitest, third-party test handlers. This complements Multitest’s Plug & Yield offering and makes the Multitest expertise available to all IDMs and test houses, independent of the handler brand. In cases where Multitest Cantilever contactors replaced competitors on third-party handlers, the result was a substantial yield improvement. Even more impressive are the dr...

Analysis
3rd November 2011
Multitest’s Mercury Proves Lowest Cost of Test

Multitest announces that the Mercury contactor proved its excellent performance during a thorough BGA test evaluation at an international IDM and is now on the list of qualified contactors for all business units. The focus of the evaluation was to find a highly cost-efficient contacting solution that delivers consistent, reliable first pass yields. For best cost of test, a long probe life must be ensured.

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