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GOEPEL electronic

GOEPEL electronic Articles

Displaying 241 - 260 of 264
Analysis
6th October 2009
GOEPEL electronic expands to China

GOEPEL electronic will open a new subsidiary in Hong Kong on 12th October 2009. This is in response to the enormously increased demands in new test and program technologies in the production areas “high volume” and “high mix”, and therefore future augmented customer support on the South Asian market. In particular application support and development services are a key operational focus.

Test & Measurement
28th September 2009
SELEX and GOEPEL co-operate to enable Boundary Scan and dynamic Functional Test in critical system environments

At the Defence Systems and Equipment International (DSEI) GOEPEL electronic, worldwide leading vendor of JTAG/Boundary Scan solutions compliant with IEEE1149.x, announced the launch of PXI 5396/FXT-x, a further series of JTAG/Boundary Scan digital I/O modules on the basis of the PXI bus. The PXI5396-FXT was developed in cooperation with SELEX Galileo and supports both the structural JTAG/Boundary Scan Test and dynamic I/O operations up to 100MHz...

Test & Measurement
24th September 2009
GOEPEL electronic - JTAG/Boundary Scan Platforms integrated into Polar Instruments Flying Prober GRS500

GOEPEL electronic, leading vendor of JTAG/Boundary Scan solutions compliant with IEEE Std.1149.x, and Polar Instruments recently developed a next generation JTAG/Boundary Scan option for the Flying Prober series with an OEM cooperation. The solution is based on a full integration of the hardware architectures ScanBooster and SCANFLEX in combination with the JTAG/Boundary Scan system software CASCON GALAXY and also involves the probe of the Polar ...

Test & Measurement
9th September 2009
Bizerba decides for JTAG/Boundary Scan Platform SCANFLEX for Integration into Agilent In-Circuit Tester

GOEPEL electronic has been selected by Bizerba to provide a SCANFLEX Boundary Scan option for the Agilent 3070 In-Circuit Tester (ICT). The integration solution is based on the PCI Boundary Scan controller SFX/PCI1149-B combined with the specific SCANFLEX TAP Transceiver SFX-TAP4/3070-PIC, enabling the execution of complex Boundary Scan tests, high-speed in-system programming (ISP) of MCU and Flash components, VarioTAP emulations tests as well a...

Test & Measurement
7th September 2009
GOEPEL electronics to run Webinars on JTAG/Boundary Scan in October

GOEPEL electronics, vendor of JTAG/Boundary Scan solutions compliant with IEEE Std.1149.x, will run free Webinars on the four Tuesdays in October 2009. The company, based in Austin, TX, will present information on topics such as the basics of JTAG/Boundary Scan and Design for Test (DfT) for Boundary Scan. Furthermore, there will be presentations discussing basic and advanced JTAG/Boundary Scan applications.

Analysis
13th August 2009
Technology partnership merges competences for extended JTAG/Boundary Scan

GOEPEL electronic, worldwide leading vendor of JTAG/Boundary Scan solutions compliant with IEEE1149.x, announces the incorporation of the company Flying Test Systems Ltd. (FTSL) into the global alliance program GATE (GOEPEL Associated Technical Experts). The focus of the cooperation is on the development and practical implementation of new elements and technologies for extended JTAG/Boundary Scan instrumentation.

Analysis
12th August 2009
Fulitech joins Technology Partner Program from GOEPEL electronic

GOEPEL electronic, a leading vendor of JTAG/Boundary Scan solutions compliant with IEEE1149.x announces the incorporation of the Chinese company Fulitech (Full Linkage Ltd.) into the global alliance program GATE (GOEPEL Associated Technical Experts).

Test & Measurement
10th August 2009
Double-sided in-line THT Inspection

GOEPEL electronic’s OptiCon TurboLine is the first system that can efficiently be utilised for Automated Optical Inspection for in-line THT manufacturing. The system allows the inspection of the component side with up to 85cm placement height. It can applied before and after the soldering process, in particular for the inspection of power assemblies, e.g. for checking polarity and electrolytic capacitors.

Test & Measurement
31st July 2009
GOPEL Combines JTAG/Boundary Scan and Optical Inspection

GOPEL electronic is offering a cost-effective hybrid JTAG/Boundary Scan and optical test system. Simple optical inspection tasks of LEDs, displays or OCR are executed by the TOM (Teachable Optical Measurement) system whilst Boundary Scan controls the board. That means users are provided with a one-stop shop of electric and optical testing, both developed and produced by GOEPEL electronic.

Micros
15th July 2009
In-System Emulation Technology supports latest Infineon XC16x Processors

GOEPEL has developed a dedicated model library for the Infineon processor family, XC16x that supports the innovative emulation technology VarioTAP. The libraries, described as VarioTAP models, are structured modularly as intelligent IP and enable a complete fusion of Boundary Scan test and JTAG emulation. By employing this technology, embedded and external flash can be in-system programmed with the help of the processor function. Furthermore, Var...

Design
9th July 2009
In-System Emulation Technology qualified for additional ARM Architecture

GOEPEL has announced the development of a special model library for ARM Cortex-M3 architecture processors to support the emulation technology VarioTAP. The libraries, described as VarioTAP models, are structured modularly as intelligent IP and enable a complete fusion of Boundary Scan test and JTAG emulation. Employing this technology, embedded or external Flash can be in-system programmed via the native processor function. Furthermore, VarioTAP ...

Test & Measurement
23rd June 2009
GOEPEL to run free Boundary Scan Training Days in UK

GOEPEL electronics is offering a free JTAG/Boundary Scan Training Day at the premises of interested parties located in UK and Ireland. The respective seminar is addressing system architects, R&D engineers as well as test production engineers to find out how versatile and effective JTAG/Boundary Scan is for the test, programming and emulation of boards and whole systems.

Test & Measurement
18th June 2009
Boundary Scan Software Platform features Automatic Program Generator for functional Emulation Test of Bus Components

GOEPEL electronic has announced the introduction of a fully automatic program generator specifically for the dynamic test of on-board system bus structures in the context of the Boundary Scan software platform SYSTEM CASCON. The newly developed tools are based on the innovative VarioTAP technology for functional emulation tests and enable a complete automation of the test vector generation, as well as for the error diagnostics for the first time ...

Test & Measurement
9th June 2009
Universal Boundary Scan tester for production integrates test electronics directly in the fixture

GOEPEL electronic recently introduced the development of JULIET (JTAG UnLimItEd Tester), a family of completely integrated stand-alone production testers. The modular systems combine all test electronics, as well as the basic mechanics in a compact desktop system. Furthermore, they are equipped with a specific interface to an exchangeable adaptor giving fast changes to accommodate different Units Under Test (UUT).

Test & Measurement
18th February 2009
Worldwide unrivalled Angled-View in GOEPEL electronic’s AOI Systems

GOEPEL electronic is now providing a module for angled-view inspection in its Automated Optical Inspection (AOI) systems. The new module generates a hitherto unrivalled field of view with excellent image quality at a 45° angle. With this the orthogonal camera’s entire inspection area is covered. Making the inspection of solder joints and components concealed by other components much more accurate. Images can be captured from any angle posit...

Design
13th February 2009
In-System Emulation Technology supports Intel XScale Architecture

GOEPEL electronic has developed a dedicated model library for the XScale processors PXA2xx and PXA3xx that supports the innovative emulation technology VarioTAP. The libraries, described as VarioTAP models, are structured modularly as intelligent IP and enable a complete fusion of Boundary Scan test and JTAG emulation. Employing this technology, frequently used NAND flash can be in-system programmed with the help of the processor function. Furthe...

Analysis
21st October 2008
“Get the total Coverage” at Electronica 2008

Global test and measurement expert, GOEPEL electronic, will showcase products at the 2008 Electronica trade in Munich, Germany focused on achieving the highest test coverage throughput the product life cycle. Comprehensive test solutions in the JTAG/Boundary Scan, AOI and Automotive test will be demonstrated at Booth A1.542 and A6.A51 from November 11th to 14th. These “Get the total Coverage” solutions are targeted for development, producti...

Test & Measurement
21st October 2008
New PXI Module enables Combination JTAG/Boundary Scan and dynamic Functional Test

GOEPEL electronic, world class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std. 1149.x, launched a new series of JTAG Digital I/O PXI modules named PXI 5396-x.

Test & Measurement
21st October 2008
New Boundary Scan fixture allows structural testing of PCI Express Plug-In Cards via IEEE1149.6

GOEPEL electronic, leading manufacturer of JTAG / Boundary Scan solutions compliant with IEEE1149.x, announced the launch of a new interface test fixture, CION Fixture™ /PCIe-x16, a further addition to the popular CION Fixture™ family. The new low cost fixture provides a predefined PCI Express x16 Slot, in which the card to be tested is inserted and thereby connected to a TAP (Test Access Port). Due to the integrated test channels IEEE 1149.1...

Analysis
18th March 2008
Streaming Technology attains real Fusion of JTAG Emulation and Boundary Scan for the first time ever claims GOEPEL

GOEPEL electronic, a JTAG/Boundary Scan vendor, has introduced an in-system emulation technology of the next generation named VarioTAP. The solution is based on a flexibly configurable streaming technology of the TAP signals based on respective µProcessor model libraries (VarioTAP Models). This means, VarioTAP enables a complete fusion of JTAG emulation and Boundary Scan test for real interlaced test operations and multivalent Flash in-system pr...

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