GOEPEL electronic Articles
Low cost Boundary Scan Controller for PCI Express
GOEPEL electronic, world-class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std. 1149.x, introduced the SCANBOOSTER/PCIe-DT, a new high-performance, and low cost Boundary Scan controller, as an addition to the company’s SCANBOOSTER™ product line.
Boundary Scan Software Platform SYSTEM CASCON provides Test Vector Link for IEEE1450 (STIL)
GOEPEL electronic, world-class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std.1149.x introduces a new test vector interface as a new extension of its software platform SYSTEM CASCON™.
GOEPEL electronic expands GATE Partner Program in Asia
GOEPEL electronic, worldwide leading vendor of JTAG/Boundary Scan solutions compliant with IEEE1149.x announces the extended incorporation of Everett Charles Technologies (ECT) into the global alliance program GATE™ (GOEPEL Associated Technical Experts).
New Optical Inspection System for Automated Conformal Coat Inspection
GOEPEL electronic offers a system for the automated optical inspection of fluorescing conformal coating. The TOM system (Teachable Optical Measurement) can be utilised for inspection of PCB coatings as well as PCB areas, which mustn’t be coated. The maximum PCB size is 460 X 400 mm.
GOEPEL electronics, Geotest and Aster Technologies to host Seminars on Design for Test
GOEPEL electronics Ltd, Geotest, and Aster Technologies will run free seminars and workshops that review the most recent advances in Boundary Scan technology and Functional Test strategies. The events will take place in Rochester, NY, Plainview, NY and Fairfield, NJ on June 22nd through 24th.
New Boundary Scan fixture enables structural test of AMC modules for ATCA systems
GOEPEL electronic announces the launch of CION Fixture /AMC, a new interface test fixture on the basis of the popular CION Fixture family.
Boundary Scan Platform SCANFLEX accesses new Debug Interfaces for Processor Emulation Test
GOEPEL electronic introduces TIC020, another TAP Interface Card (TIC) within the frame of the JTAG/Boundary Scan hardware platform SCANFLEX. The new TIC module features a programmable multi bus interface, which enables a nearly unlimited compatibility to numerous standardised and proprietary test and debug protocols and, consequently, several thousand micro controllers.
GOEPEL electronic adds CSI to GATE Partner Program
GOEPEL electronic announces the incorporation of the company Custom Systems Integration Incorporated (CSI) out of Endicott, NY into its global alliance program GATE™ (GOEPEL Associated Technical Experts).
VarioTAP supports non JTAG Interfaces
During its „Boundary Scan Days Germany“, GOEPEL electronic introduced the further development of the innovative emulation technology VarioTAP for the support of non JTAG debug interfaces. The new features enable the broad coverage of various proprietary debug architectures of different chip manufacturers without utilising processor specific pods. The first interfaces to be supported are the so called BDM interface (Background Debug Mode) and...
Boundary Scan Module extends structural Test Coverage to DDR3 Memory Interfaces
GOEPEL electronic officially introduces the CION Module/SO-DIMM204-3 as a new member of the company’s CION product family. This new low-cost, digital I/O module is controlled through an IEEE 1149.1 TAP (Test Access Port) and provides resources for connectivity testing of all signal and voltage supply pins on DDR3-SDRAM SO-DIMM204 sockets compliant with JEDEC standards JESD21-C and JESD79-3C.
GOEPEL electronics appoints ATM as Sales Representative for the Mid Atlantic to the North Eastern United States.
GOEPEL electronics has selected Advanced Technical Marketing (ATM) as its Sales Representative for the Mid Atlantic to the North Eastern United States. The New Jersey based Company will provide professional, high quality representation services for GOEPEL electronics’ wide range of hardware and software solution for multidimensional JTAG/Boundary Scan instrumentation. ATM has representatives in New England, Upstate New York, Metro NY & NJ, PA...
Goepel's theme at SMT/Hybrid/Packaging 2010 is “Best in Test”
At this year’s SMT/Hybrid/Packaging in Nuremberg/Germany, GOEPEL electronic will exhibit its award winning test solutions in Automated Inspection (AOI/AXI) and JTAG/Boundary Scan technology. In hall 6, stand 410 the Company will demonstrate its technological leadership in the fields of optical and electronic test and measurement.
EMS Company Limtronik opts for GOEPEL electronic’s AXI System
The German contract manufacturer Limtronik has decided on GOEPEL electronic’s Automated X-Ray Inspection system OptiCon X-Line 3D for enhanced quality assurance of its products. In addition to the system’s test speed, the critical factors in favour of this decision were the in-line ability and 3D functionality of the AXI machine. Moreover, as far as future innovations and service are concerned, Limtronik decided for an AXI direct from an O...
In-System Emulation technology VarioTAP expands to support Xilinx FPGA
GOEPEL electronic announces the development of model libraries for Xilinx® FPGAs with integrated PowerPC® cores for support of GOEPEL electronic’s innovative emulation technology VarioTAP®. VarioTAP® model libraries are structured modular with IP (Intellectual Property) functions and enable a complete fusion of Boundary Scan test and JTAG Emulation. In addition to interlaced Bus Emulation Tests (BET) and System Emulation Tests (SET) for en...
GOEPEL electronic wins “Best in Test Award” for the fifth Time in a Row
For the fifth time in a row GOEPEL electronic received the „Best in Test Award“ of the international magazine and website „Test & Measurement World“. GOEPEL electronic’s JTAG/Boundary Scan production tester JULIET was awarded for being another extraordinary innovation in Boundary Scan technology. This is a special honour, because numerous companies and their products apply for this award each year, thus the “Best in Test Awards” ar...
Boundary Scan Software Platform SYSTEM CASCON automates hierarchical Test of Multi Chip Modules
GOEPEL electronic introduces new features to specially support hierarchical tests of Multi Chip Modules (MCM) as new extension of its software platform SYSTEM CASCON. The enhanced tools provide a hitherto unrivalled automation level for the generation of module and board centric Boundary Scan tests based on hierarchical library models.
GOEPEL electronic’s expands GATE Partner Program
GOEPEL electronic announces the extended incorporation of the Danish company DSE Test Solutions A/S into the global alliance program GATE (GOEPEL Associated Technical Experts). The focus of the cooperation is the development and practical implementation of new products and modules based on JTAG/Boundary Scan instrumentation as well as enhancements in the integration of JTAG/Boundary Scan products in existing test systems built up from DSE Test S...
New low cost Boundary Scan Controller for PCI Bus
At the “Embedded World” in Nuremberg/Germany GOEPEL electronic, a world-class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std. 1149.x introduces the SCANBOOSTER/PCI-DT, a new high-performance, low cost Boundary Scan controller, as an addition to the company’s SCANBOOSTER™ product line.
Universal Boundary Scan tester and revolutionary Emulation Technology at NEPCON China
At NEPCON China from 20th-22nd April 2010, GOEPEL electronic will exhibit the recently introduced JULIET™ (JTAG UnLimItEd Tester), a family of completely integrated stand-alone production testers. The modular systems combine all test electronics, as well as the basic mechanics in a compact desktop system. Furthermore, they are equipped with a specific interface to an exchangeable adaptor giving fast changes to accommodate different Units Under ...
GOEPEL electronics will run New Technology Days in UK in 2010
GOEPEL electronics, leading vendor of JTAG/Boundary Scan equipment and Automated Inspection systems (AOI/AXI) will run its New Technology Days in the UK in 2010. These events will take place on the 9th March 2010 in Duxford and the 11th March 2009 in Bristol. The seminars will be covering latest developments, applications and outlooks in JTAG/Boundary Scan, Functional Test, optical inspection technologies and automotive test solutions.